[1] Da J, Qu H M, Tao T Y et al. Real-time three-dimensional measurement composite of epipolar constraint and speckle correlation[J]. Acta Optica Sinica, 36, 1012003(2016).

[2] Harding K. Industrial metrology: engineering precision[J]. Nature Photonics, 2, 667-669(2008).

[3] Xu J, Liu S L, Wan A et al. An absolute phase technique for 3D profile measurement using four-step structured light pattern[J]. Optics and Lasers in Engineering, 50, 1274-1280(2012).

[4] Liu Y K, Su X Y, Wu Q Y. Three-dimensional shape measurement for specular surface based on fringe reflection[J]. Acta Optica Sinica, 26, 1636-1640(2006).

[5] Tao T, Guo H W, He H T. Overview of optical three-dimensional measurement technique for specular reflection surfaces[J]. Optical Instruments, 27, 90-95(2005).

[6] Ou P, Wang T, Li R X. A three-dimensional teeth measurement system based on structured light[J]. Laser & Optoelectronics Progress, 53, 011102(2016).

[7] Zhang Z H. Review of single-shot 3D shape measurement by phase calculation-based fringe projection techniques[J]. Optics and Lasers in Engineering, 50, 1097-1106(2012).

[8] Zhang Z H, Wang Y M, Huang S J et al. Three-dimensional shape measurements of specular objects using phase-measuring deflectometry[J]. Sensors, 17, 2835(2017).

[9] Balzer J, Werling S. Principles of shape from specular reflection[J]. Measurement, 43, 1305-1317(2010).

[10] Xiao Y L, Su X Y, Chen W J. Specular shape measurement with phase measuring deflectometry based on bundle adjustment[J]. Acta Optica Sinica, 31, 1212007(2011).

[11] Zhao P, Gao N, Zhang Z H et al. Performance analysis and evaluation of direct phase measuring deflectometry[J]. Optics and Lasers in Engineering, 103, 24-33(2018).

[12] Liu Y, Huang S J, Zhang Z H et al. Full-field 3D shape measurement of discontinuous specular objects by direct phase measuring deflectometry[J]. Scientific Reports, 7, 10293(2017).

[13] Zhan Z Q. Camera calibration method and application research based on flat LCD[D]. Wuhan: Wuhan University(2006).

[14] Petz M, Tutsch R. Reflection grating photogrammetry: a technique for absolute shape measurement of specular free-form surfaces[J]. Proceedings of SPIE, 5869, 58691D(2005).

[15] Bartsch J, Nüß J R. Prinzler M H U, et al. Effects of non-ideal display properties in phase measuring deflectometry: a model-based investigation[J]. Proceedings of SPIE, 10678, 106780Y(2018).

[16] Huang R. High precision optical surface metrology using deflectometry[D]. Tucson:The University of Arizona(2015).

[17] Zhang Z. A flexible new technique for camera calibration[J]. IEEE Transactions on Pattern Analysis and Machine Intelligence, 22, 1330-1334(2000).

[18] Cai Z W, Liu X L, Jiang H et al. Flexible phase error compensation based on Hilbert transform in phase shifting profilometry[J]. Optics Express, 23, 25171-25181(2015).

[19] Zhang Z H, Towers C E, Towers D P. Time efficient color fringe projection system for 3D shape and color using optimum 3-frequency selection[J]. Optics Express, 14, 6444-6455(2006).