[1] Tang C W, Vanslyke S A.Appl.Phys.Lett., 1987, 51: 913.
[2] Yang Y, Westerweele E, Zhang C, et al.J.Appl.Phys., 1995, 77: 694.
[3] Hung L S, Tang C W, Mason M G.Appl.Phys.Lett., 1997, 70: 152.
[4] Mason M G, Hung L S, Tang C W, et al.J.Appl.Phys., 1999, 86: 1688.
[5] Heeks S K, Burroughes J H, Towns C, et al.J.Soc.Inf.Disp., 2000, 10: 139.
[7] Xie Guohua, Meng Yanlong, Wu Fengmin, et al.Appl.Phys.Lett., 2008, 92: 093305.
[8] Blochwitz J, Pfeiffer M, Fritz T, et al.Appl.Phys.Lett., 1998, 73: 729.
[9] Pfeiffer M, Beyer A, Fritz T, et al.Appl.Phys.Lett., 1998, 73: 3202.
[10] Luo Y, Aziz H, Xu G, et al.J.Appl.Phys., 2007, 101: 054512.
[11] Kaushik Roy Choudhury, Jong-hyuk Yoon, Franky So.Adv.Mater., 2008, 20: 1456.
[12] Feng X D, Huang C J, Lui V, et al.Appl.Phys.Lett., 2005, 86: 143511.
[13] Chen S Y, Chu T Y, Chen J F, et al.Appl.Phys.Lett., 2006, 89: 053518.
[14] Huang J, Li G, Wu E, et al.Adv.Mater.2006, 18: 114.
[15] Li J, Yahiro M, Ishida K, et al.Synth.Met., 2005, 151: 141.
[16] Van Slyke S A, Chen C H, Tang C W.Appl.Phys.Lett., 1996, 69: 2160.
[17] Jiang Xueyin, Zhang Zhilin, Cao Jin, et al.Solid-State Electronics, 2008, 52: 952.
[18] You Han, Dai Yanfeng, Zhang Zhiqiang, et al.J.Appl.Phys., 2007, 101: 026105.
[19] Ikeda H, Sakata J, Hayakawa M, et al.SID Digest, 2006, 37: 923.
[20] Matsushima T, Kinoshita Y, Murata H.Appl.Phys.Lett., 2007, 91: 253504.
[21] Wang Hui, Klubek Kevin P, Tang C W.Appl.Phys.Lett., 2008, 93: 093306.