• Acta Optica Sinica
  • Vol. 27, Issue 10, 1896 (2007)
[in Chinese]*, [in Chinese], [in Chinese], [in Chinese], [in Chinese], and [in Chinese]
Author Affiliations
  • [in Chinese]
  • show less
    DOI: Cite this Article Set citation alerts
    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Thin-Film-Optimized Broadband Achromatic Quarter-Wave Phase Retarder[J]. Acta Optica Sinica, 2007, 27(10): 1896 Copy Citation Text show less

    Abstract

    Based on the total-reflection phase transformation theory, the Fresnel rhomb retarder is obtained with a structure angle with which the phase retardation is insensitive to the angle of incidence. According to thin film polarization effect and eigenmatrix, the Fresnel retarder's achromatic width is expanded by evaporating dielectric membrane in two total-reflection surfaces of the rhomb. Using the ML_EB900 film coating machine, the rhomb achromatic phase delay membrane is fabricated with appropriate deposition condition. The experimental result indicated, in 530~700 nm wavelength ranges, 90° phase retardation and maximum deviation within 0.7° were obtained.
    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Thin-Film-Optimized Broadband Achromatic Quarter-Wave Phase Retarder[J]. Acta Optica Sinica, 2007, 27(10): 1896
    Download Citation