• Opto-Electronic Engineering
  • Vol. 37, Issue 10, 41 (2010)
CAI Huai-yu1、2、*, WANG Zhuang1、2, WANG Wen-tao1、2, FANG Lei1、2, and HUANG Zhan-hua1、2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: Cite this Article
    CAI Huai-yu, WANG Zhuang, WANG Wen-tao, FANG Lei, HUANG Zhan-hua. Design of Tire Roundness Error Detection System[J]. Opto-Electronic Engineering, 2010, 37(10): 41 Copy Citation Text show less
    References

    [1] YANG Qi,WANG Hai,FENG Yan-long,et al. Technology of temperature measurement at tire curing [J]. Tire Industry,2003,28(8):496-499.

    [2] Pastorius W,Sanden M. Laser Sensor Innovations Improve Tire Manufacturing [J]. Rubber World(S0035-9572),2009,240(6):22-23.

    [3] WU Qi,LIU Hong-bin,HU De-jin,et al. On-site Measurement of Roundness Error Based on Error Separation Technique [J].China Mechanical Engineering,2006,17(8):120-123.

    [4] YU Dao-yin,TAN Heng-ying. Engineering Optics [M]. Beijing:China Machine Press,2006.

    [5] LIU Wei,HAN Xu-dong,AI Hua,et al. Application of Laser Triangulation in Displacement Measurement [J]. Optics and Precision Engineering,2004,12(4):104-107.

    [6] HU Shu-guang,CHEN Jing,HUA Yan-qiu,et al. Design of Sensor Based on Laser Trigonometry [J]. Measurement and Control Technology,2006,25(6):7-8.

    [7] HUA Shi-qun,LUO Ying,ZHAO Guo-qi. Method of measuring roundness error based on slit diffraction [J]. Opto-Electronic Engineering,2007,34(3):140-144.

    [8] HUANG Zhan-hua,CAI Huai-yu,LI He-qiao,et al. Analysis for Error in Triangular Laser Measurement System and an Elimination Method [J]. Opto-Electronic Engineering,2002,29(3):58-61.

    [9] Sanden M,Pastorius W. High-speed Tire Inspection [J]. Tire Technology International(S0969-7217),2007,6:149-150.

    [10] K M Jeong,K W Kim,H G Beom,et al. Finite Element Analysis of Nonuniformity of Tires with Imperfections [J]. Tire Science and Technology(S0090-8657),2007,35(3):226-238.

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    CAI Huai-yu, WANG Zhuang, WANG Wen-tao, FANG Lei, HUANG Zhan-hua. Design of Tire Roundness Error Detection System[J]. Opto-Electronic Engineering, 2010, 37(10): 41
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