• Infrared and Laser Engineering
  • Vol. 50, Issue 9, 20200425 (2021)
Shijie Chen, Chunhui Niu, Xiaoying Li, and Yong Lv
Author Affiliations
  • School of Instrument Science and Opto Electronics Engineering, Beijing Information Science & Technology University, Beijing 100192, China
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    DOI: 10.3788/IRLA20200425 Cite this Article
    Shijie Chen, Chunhui Niu, Xiaoying Li, Yong Lv. Cat eye echo characteristics of optical imaging system in CCD damage process[J]. Infrared and Laser Engineering, 2021, 50(9): 20200425 Copy Citation Text show less
    CCD point damage, line damage, full target damage imaging images
    Fig. 1. CCD point damage, line damage, full target damage imaging images
    Change curve of cat eye echo power and degree of polarization under different CCD damage states
    Fig. 2. Change curve of cat eye echo power and degree of polarization under different CCD damage states
    Microscopic images (a)-(c) and contour images (d)-(e) of damage sites under different damage states
    Fig. 3. Microscopic images (a)-(c) and contour images (d)-(e) of damage sites under different damage states
    Relation curves between the polarization degree of echo scattering and the surface roughness of target for cat’s eye of different materials
    Fig. 4. Relation curves between the polarization degree of echo scattering and the surface roughness of target for cat’s eye of different materials
    Cat eye echo power (a) and degree of polarization (b) vary with the number of pulses
    Fig. 5. Cat eye echo power (a) and degree of polarization (b) vary with the number of pulses
    Surface morphology of different damage sites
    Fig. 6. Surface morphology of different damage sites
    RMS height Sq/μm Point damageLine damageFull target damage
    The first group4.1323.9194.006
    The second group3.8954.0363.940
    Table 1. RMS height measurement results of material surface
    ItemPulse number
    012345678
    RMS height Sq/μm 4.1350.0120.0070.4910.4400.3700.3520.5160.650
    Table 2. Root mean square height measurement results of material surface
    Shijie Chen, Chunhui Niu, Xiaoying Li, Yong Lv. Cat eye echo characteristics of optical imaging system in CCD damage process[J]. Infrared and Laser Engineering, 2021, 50(9): 20200425
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