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    Journals >Opto-Electronic Engineering >Volume 42 >Issue 8 >Page 14 > Article
    • Opto-Electronic Engineering
    • Vol. 42, Issue 8, 14 (2015)
    Precise Measurement of Flatness for Large Diameter Narrow Zone Annular Plane
    CHEN Baogang*, SHAO Liang, and LI Jianfeng
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  • [in Chinese]
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    DOI: 10.3969/j.issn.1003-501x.2015.08.003 Cite this Article
    CHEN Baogang, SHAO Liang, LI Jianfeng. Precise Measurement of Flatness for Large Diameter Narrow Zone Annular Plane[J]. Opto-Electronic Engineering, 2015, 42(8): 14 Copy Citation Text show less
    References

    [2] MALACARA D. Optical Shop Testing [M]. New York: John Wiley&Sons, 1992: 126-143.

    CLP Journals

    [1] HE Wenyan, CAO Xuedong, KUANG Long, ZHANG Peng. A Preliminary Based on Structured-light for Flatness Measurement of Large Annular Planes[J]. Opto-Electronic Engineering, 2016, 43(11): 7

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    CHEN Baogang, SHAO Liang, LI Jianfeng. Precise Measurement of Flatness for Large Diameter Narrow Zone Annular Plane[J]. Opto-Electronic Engineering, 2015, 42(8): 14
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