Xiaoguo Jiang, Zhijun Chi, Shuqing Liao, Yingchao Du, Guojun Yang, Xiaoding Zhang, Hong Li, Xinglin Yang, Wei Jiang, Tao Wei, Yuan Wang. Simulation for measurement technique of electron beam divergence basing on Cherenkov radiation[J]. High Power Laser and Particle Beams, 2022, 34(5): 054002
- High Power Laser and Particle Beams
- Vol. 34, Issue 5, 054002 (2022)
Fig. 1. Cherenkov radiation from a single electron
Fig. 2. Layout of the simulation work basing on measurement system principle
Fig. 3. Divergence images for ideal electron beam after passing through SiO2 slice with different thickness
Fig. 4. Impulsion response function of SiO2 slice and Mylar film with different thickness
Fig. 5. Influence of index of SiO2 detector on beam divergence
Fig. 6. Measurement precision simulation for different beam divergence
Fig. 7. Comparison of electron beam divergence with different simulation methods
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