• Chinese Optics Letters
  • Vol. 8, Issue s1, 216 (2010)
Jun’e Liu, Zhongda Guo, Weiguo Liu, and Huan Liu
Author Affiliations
  • Shaanxi Province Thin Film Technology and Optical Test Open Key Laboratory, Xi’an Technological University, Xi’an 710032, China
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    DOI: 10.3788/COL201008s1.0216 Cite this Article Set citation alerts
    Jun’e Liu, Zhongda Guo, Weiguo Liu, Huan Liu. Patterning process of SiO2 film and fabrication of Si V-groove[J]. Chinese Optics Letters, 2010, 8(s1): 216 Copy Citation Text show less

    Abstract

    In the process of silicon wet etching, the SiO2 film formed by thermal oxidation is firm and compact, and it is an excellent mask material. However, there are some difficulties in its patterning process. Considering the high density of the SiO2 film, its etching time is so long that the protective layer photoresist wrinkles and floats. In this letter, a novel way is used to achieve the graphical process resorting to the MgO film. A layer of the MgO film as the protective layer is deposited on the surface of the SiO2 film, and inductively coupled plasma etching is used to etch the SiO2 film. Then the chip is put in the KOH solution to fabricate the Si V-groove. The results show that the patterning process is easy to control.
    Jun’e Liu, Zhongda Guo, Weiguo Liu, Huan Liu. Patterning process of SiO2 film and fabrication of Si V-groove[J]. Chinese Optics Letters, 2010, 8(s1): 216
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