• Electronics Optics & Control
  • Vol. 26, Issue 1, 73 (2019)
GU Ze-ling, MEMG Ling-jun, and REN Kai-fei
Author Affiliations
  • [in Chinese]
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    DOI: 10.3969/j.issn.1671-637x.2019.01.016 Cite this Article
    GU Ze-ling, MEMG Ling-jun, REN Kai-fei. Analysis on Test Result for SEU of FPGA in Simulated Low-Altitude Environment[J]. Electronics Optics & Control, 2019, 26(1): 73 Copy Citation Text show less
    References

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    [8] JAHANIRAD H, MOHAMMADI K.Reliable implementation on SRAM-based FPGA using evolutionary methods[J].IETE Journal of Research, 2013, 59(5):597-603.

    [9] KVAS M, VALACH S, FIEDLER P.Reliability and safety issues of FPGA based designs[J].IFAC Proceedings Volumes, 2012, 45(7):201-206.

    [10] AZAMBUJA J R, KASTENSMIDT F, BECKER J.Configuration bitstream fault injection experimental results[M]//AZAMBUJA J R, KASTENSMIDT F, BECKER J.Hybrid fault tolerance techniques to detect transient faults in embedded processors.Berlin:Springer International Publishing, 2014:69-74.

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    GU Ze-ling, MEMG Ling-jun, REN Kai-fei. Analysis on Test Result for SEU of FPGA in Simulated Low-Altitude Environment[J]. Electronics Optics & Control, 2019, 26(1): 73
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