Influence of Light Sources of Different Wavelengths on Scattering Rate of Defects

Xudong Wang; Aihua Gao; Lirong Yan; Wengang Qin; Wenjin Li

doi:10.3788/LOP202259.1112002

Journals >Laser & Optoelectronics Progress >Volume 59 >Issue 11 >Page 1112002 > Article

Laser & Optoelectronics Progress
Vol. 59, Issue 11, 1112002 (2022)

Influence of Light Sources of Different Wavelengths on Scattering Rate of Defects

Xudong Wang, Aihua Gao^*, Lirong Yan, Wengang Qin, and Wenjin Li

Author Affiliations

School of Optoelectronic Engineering, Xi’an Technological University, Xi’an 710021, Shaanxi , China

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DOI: 10.3788/LOP202259.1112002 Cite this Article Set citation alerts

Xudong Wang, Aihua Gao, Lirong Yan, Wengang Qin, Wenjin Li. Influence of Light Sources of Different Wavelengths on Scattering Rate of Defects[J]. Laser & Optoelectronics Progress, 2022, 59(11): 1112002 Copy Citation Text

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Fig. 1. Schematic of integrated scattering detection

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Fig. 2. Spectral response curves of photomultiplier tube

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Fig. 3. Comparison of sample scattering rate in two working modes

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Fig. 4. Comparison of sample scattering rate in two working modes

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Parameter type	Value
Anode sensitivity /（V·nW^-1）	15
Cathode sensitivity /（mA·W^-1）	78
Current gain M	10⁵

Table 1. Partial characteristic parameter table of photomultiplier tube

λ /nm	Reference	voltage	value /V	Average voltage value /V
635	3.7600	3.7620	3.7590	3.7603
525	2.9210	2.9200	2.9180	2.9197
405	0.3715	0.3720	0.3718	0.3718

Table 2. Reference voltage values corresponding to light sources of different wavelengths (80 mW)

λ /nm	Reference	voltage	value /V	Average voltage value /V
635	2.5700	2.5690	2.5710	2.5700
525	1.9780	1.9770	1.9790	1.9780
405	0.2559	0.2560	0.2561	0.2560

Table 3. Reference voltage values corresponding to light sources of different wavelengths (50 mW)

λ /nm	Sample	voltage	value /V	Average voltage value /V
635	3.7555	3.7560	3.7558	3.7558
525	3.0350	3.0360	3.0340	3.0350
405	0.4510	0.4513	0.4508	0.4510

Table 4. Voltage values of sample to be tested corresponding to light sources of different wavelengths (80 mW)

λ /nm	Sample	voltage	value /V	Average voltage value /V
635	2.5600	2.5590	2.5610	2.5600
525	2.0210	2.0220	2.0200	2.0210
405	0.3060	0.3061	0.3059	0.3060

Table 5. Voltage values of sample to be tested corresponding to light sources of different wavelengths (50 mW)

λ /nm	Scattering rate
635	0.009988
525	0.010395
405	0.012130

Table 6. Scattering rate data of sample to be tested corresponding to light sources of different wavelengths (80 mW)

λ /nm	Scattering rate
635	0.009961
525	0.010217
405	0.011953

Table 7. Scattering rate data of the sample to be tested corresponding to light sources of different wavelengths (50 mW)

λ /nm	Sample	voltage	value /V	Average voltage value /V
635	4.4300	4.4295	4.4297	4.4297
525	3.6920	3.6917	3.6922	3.6920
405	0.5780	0.5778	0.5782	0.5780

Table 8. Voltage value of sample to be tested corresponding to light sources of different wavelengths (80 mW)

λ /nm	Scattering rate
635	0.011780
525	0.012645
405	0.015546

Table 9. Scattering rate data of sample to be tested corresponding to light sources of different wavelengths (80 mW)

λ /nm	Sample	voltage	value /V	Average voltage value /V
635	2.9870	2.9868	2.9871	2.9870
525	2.4340	2.4339	2.4338	2.4339
405	0.3680	0.3677	0.3681	0.3679

Table 10. Voltage value of sample to be tested corresponding to light sources of different wavelengths (50 mW)

λ /nm	Scattering rate
635	0.011623
525	0.012305
405	0.014371

Table 11. Scattering rate data of sample to be tested corresponding to light sources of different wavelengths (50 mW)

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