• Infrared and Laser Engineering
  • Vol. 36, Issue 5, 680 (2007)
[in Chinese]* and [in Chinese]
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  • [in Chinese]
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    [in Chinese], [in Chinese]. Laser damage issues of optical coating for the mid-infrared[J]. Infrared and Laser Engineering, 2007, 36(5): 680 Copy Citation Text show less
    References

    [1] PALMER J R.Environmental study of single and multilayer dielectric films for 2.8μm subjected to humidity,ethanol,HF and H2S[C]// Proc Boulder Damage Symposium NBS SP,1982,669:322-348.

    [2] MILWARD J R,LEWIS K L,PITT A M,et al.Laser damage issues for mid-IR optical parametric oscillator mirrors[C]//Proceedings of SPIE,Laser-Induced Damage in Optical Materials,1993,2114:220-230.

    [3] LEWIS K L,PITT A M,CORBETT M,et al.Progress in Optical Coatings for the Mid-Infrared[C]// Proceedings of SPIE,Laser-Induced Damage in Optical Materials,1996,2966:166-177.

    [4] HOLMES S LDielectric-enhanced mirrors for 2-6μm region[C]//Proc Boulder Damage Symposium NBS SP,1977,509:385-398.

    [5] PORTEUS J O,DONOVAN T M,JERNIGAN J L,et al.Multithreshold evaluation of 100 ns pulsed laser damage to coating materials at 2.7 and 3.8μm wavelengths[C]//Proc Boulder Damage Symposium NBS SP,1978,541:202-211.

    [6] DETRIO J A,PETTY R D.CW laser damage in AR coated alkaline earth fluorides at 3.8μm[C]//Proc Boulder Damage Symposium NBS SP,1978,541:78-85.

    [11] AMINOU D M A.Broadband optical coatings for the novel high-power wide-tuning-range OPO lasers[C]//Proceedings of SPIE,Laser-Induced Damage in Optical Materials,1991,1624:304-313.

    [12] DINCA A,DINCA M,LUPEI V.Dielectric mirrors coating of the active medium for diode pumped Erbium laser[C]//Proceedings of SPIE,Solid State Lasers Ⅵ,1997,2986:203-212.

    [13] FOURNET C,PINOT B,GEENEN B,et al.High damage threshold mirrors and polarizers in the ZrO2/SiO2 and HfO2/SiO2 dielectric systems[C]// Proceedings of SPIE,LaserInduced Damage in Optical Materials,1991,1624:282-293.

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    [in Chinese], [in Chinese]. Laser damage issues of optical coating for the mid-infrared[J]. Infrared and Laser Engineering, 2007, 36(5): 680
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