High-frequency characterization of high-speed modulators and photodetectors in a link with low-speed photonic sampling

Mengke Wang; Shangjian Zhang; Zhao Liu; Xuyan Zhang; Yutong He; Yangxue Ma; Yali Zhang; Zhiyao Zhang; Yong Liu

doi:10.1088/1674-4926/42/4/042303

[1] J Capmany, J Mora, I Gasulla et al. Microwave photonic signal processing. J Lightwave Technol, 31, 571(2013).

[2] D Marpaung, J P Yao, J Capmany. Integrated microwave photonics. Nat Photon, 13, 80(2019).

[3] X K Yi, S X Chew, S J Song et al. Integrated microwave photonics for wideband signal processing. Photonics, 4, 46(2017).

[4] C Wang, M Zhang, X Chen et al. Integrated lithium niobate electro-optic modulators operating at CMOS-compatible voltages. Nature, 562, 101(2018).

[5] K Sun, A Beling. High-speed photodetector for microwave photonics. Appl Sci, 9, 623(2019).

[6] Y Q Shi, L S Yan, A E Willner. High-speed electrooptic modulator characterization using optical spectrum analysis. J Lightwave Technol, 21, 2358(2003).

[7] Y Liao, H J Zhou, Z Meng. Modulation efficiency of a LiNbO₃ waveguide electro-optic intensity modulator operating at high microwave frequency. Opt Lett, 34, 1822(2009).

[8] Q Y Ye, C Yang, Y H Chong. Improved frequency response measurement method of half-wave voltage for phase modulator. Optik, 125, 745(2014).

[9] W Rideout, E Eichen, J Schlafer et al. Relative intensity noise in semiconductor optical amplifiers. IEEE Photon Technol Lett, 1, 438(1989).

[10] E Eichen, J Schlafer, W Rideout et al. Wide-bandwidth receiver photodetector frequency response measurements using amplified spontaneous emission from a semiconductor optical amplifier. J Lightwave Technol, 8, 912(1990).

[11] F Z Xie, D Kuhl, E H Böttcher et al. Wide-band frequency response measurements of photodetectors using low-level photocurrent noise detection. J Appl Phys, 73, 8641(1993).

[12] D M Baney, W V Sorin, S A Newton. High-frequency photodiode characterization using a filtered intensity noise technique. IEEE Photon Technol Lett, 6, 1258(1994).

[13] Y Shao, R L Gallawa. Fiber bandwidth measurement using pulse spectrum analysis. Appl Opt, 25, 1069(1986).

[14] R T Hawkins, M D Jones, S H Pepper et al. Comparison of fast photodetector response measurements by optical heterodyne and pulse response techniques. J Lightwave Technol, 9, 1289(1991).

[15] L X Wang, N H Zhu, J H Ke et al. Improved peak power method for measuring frequency responses of photodetectors in a self-heterodyne system. Microw Opt Technol Lett, 52, 2199(2010).

[16] A Miao, Y Q Huang, H Huang et al. Wideband calibration of photodetector frequency response based on optical heterodyne measurement. Microw Opt Technol Lett, 51, 44(2009).

[17] C Koch. Measuring the photodetector frequency response for ultrasonic applications by a heterodyne system with difference-frequency servo control. IEEE T Ultrason Ferr, 57, 1169(2010).

[18] T Dennis, P D Hale. High-accuracy photoreceiver frequency response measurements at 1.55 µm by use of a heterodyne phase-locked loop. Opt Express, 19, 20103(2011).

[19] X J Feng, P Yang, L B He et al. Heterodyne system for measuring frequency response of photodetectors in ultrasonic applications. IEEE Photon Technol Lett, 28, 1360(2016).

[20] P D Hale, D F Williams. Calibrated measurement of optoelectronic frequency response. IEEE Trans Microw Theory Tech, 51, 1422(2003).

[21] X M Wu, J W Man, L Xie et al. Novel method for frequency response measurement of optoelectronic devices. IEEE Photon Technol Lett, 24, 575(2012).

[22] Q Y Ye, C Yang, Y H Chong. Measuring the frequency response of photodiode using phase-modulated interferometric detection. IEEE Photon Technol Lett, 26, 29(2013).

[23] X M Wu, J W Man, L Xie et al. A new method for measuring the frequency response of broadband optoelectronic devices. IEEE Photon J, 4, 1679(2012).

[24] S J Zhang, C Zhang, H Wang et al. Self-calibrated microwave characterization of high-speed optoelectronic devices by heterodyne spectrum mapping. J Lightwave Technol, 35, 1952(2017).

[25] S J Zhang, C Zhang, H Wang et al. On-wafer probing-kit for RF characterization of silicon photonic integrated transceivers. Opt Express, 25, 13340(2017).

[26] S J Zhang, H Wang, X H Zou et al. Electrical probing test for characterizing wideband optical transceiving devices with self-reference and on-chip capability. J Lightwave Technol, 36, 4326(2018).

[27] S J Zhang, W Li, W Chen et al. Accurate calibration and measurement of optoelectronic devices. J Lightwave Technol(2020).

[28] Y X Ma, Z Y Zhang, S J Zhang et al. Self-calibrating microwave characterization of broadband Mach–Zehnder electro-optic modulator employing low-speed photonic down-conversion sampling and low-frequency detection. J Lightwave Technol, 37, 2668(2018).

[29] S J Zhang, C Zhang, H Wang et al. Calibration-free measurement of high-speed Mach-Zehnder modulator based on low-frequency detection. Opt Lett, 41, 460(2016).