Nondestructive Measurement of RDX Grain’s Internal Pressure by Using Raman Spectrum Method

LI Yuan-xin; CHANG Sheng-li; PENG Xiang-yang

doi:10.3964/j.issn.1000-0593(2017)02-0472-04

Journals >Spectroscopy and Spectral Analysis >Volume 37 >Issue 2 >Page 472 > Article

Spectroscopy and Spectral Analysis
Vol. 37, Issue 2, 472 (2017)

Nondestructive Measurement of RDX Grain’s Internal Pressure by Using Raman Spectrum Method

LI Yuan-xin^1、2、*, CHANG Sheng-li², and PENG Xiang-yang¹

Author Affiliations

¹[in Chinese]

²[in Chinese]

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DOI: 10.3964/j.issn.1000-0593(2017)02-0472-04 Cite this Article

LI Yuan-xin, CHANG Sheng-li, PENG Xiang-yang. Nondestructive Measurement of RDX Grain’s Internal Pressure by Using Raman Spectrum Method[J]. Spectroscopy and Spectral Analysis, 2017, 37(2): 472 Copy Citation Text

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References

[1] De Wolf I. Semiconductor Science Technology, 1996, 11(2): 139.

[2] Jacqueline Akhavan. Spectrochimica Acta Part A Molecular Spectroscopy, 1991, 47(91): 1247.

[3] Yoshikawa, Murakami, Maxsnda, et al. Japanese Journal of Applied Physics, 2006; 19(45): 486.

[4] John A H. Journal of Physical Chemistry B, 2008, 112(25): 7489.

LI Yuan-xin, CHANG Sheng-li, PENG Xiang-yang. Nondestructive Measurement of RDX Grain’s Internal Pressure by Using Raman Spectrum Method[J]. Spectroscopy and Spectral Analysis, 2017, 37(2): 472

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