• Acta Optica Sinica
  • Vol. 22, Issue 8, 897 (2002)
[in Chinese]1, [in Chinese]1、*, [in Chinese]2, and [in Chinese]2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Modeling Reflectance Function from Rough Surface and Algorithms[J]. Acta Optica Sinica, 2002, 22(8): 897 Copy Citation Text show less
    References

    [1] Tomiyasu K. Relationship between and measurement of differential scattering coefficient and bidirectional reflectance distribution function (BRDF). IEEE, 1988, GE-26(5):660~665

    [2] Gibbs D P, Betty C L, Fung A K et al..Automated measurement of polarized bidirectional reflectance. Remote Sense Environ, 1993, 43(2):97~114

    [3] Cook R L, Torrance K E. A reflectance model for computer graphics. ACM Siggraph, 1981, 15(3):307~316

    [4] Phong B T. Illumination for computer generated pictures. Communications of ACM, 1975, 18(6):311~317

    [5] Ward G J. Measuring and modeling anisotropic reflection. Computer Graphics, 1992, 26(2):265~272

    [7] Torrance K, Sparrow E. Theory or off-specular reflection from roughened surfaces. J. Opt. Soc. America, 1967, 57(9):1105~1115

    [9] Yang G, Reinstein L E, Pai S et al.. A new genetic algorithm technique in optimization of permanent 125-I prostate implants. Medical Physics, 1998, 25(12):2308~2315

    [10] Carroll D L. Chemical laser modeling with genetic algorithms. AIAA J., 1996, 34(2):338~346

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Modeling Reflectance Function from Rough Surface and Algorithms[J]. Acta Optica Sinica, 2002, 22(8): 897
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