[3] TANG Chen, ZHANG Fang, CHEN Zhan-qing. Contrast Enhancement for Electronic Speckle Pattern Interferometry Fringes by The Differential Equation Enhancement Method [J]. Applied Optics(S1559-128X), 2006, 45(10): 2287-2294.
[8] LI Can-can, TANG Chen, YAN Hai-qing, et al. Localized Fourier Transform Filter for Noise Removal in Electronic Speckle Pattern Interferometry Wrapped Phase Patterns [J]. Applied Optics(S1559-128X), 2011, 50(24): 4903-4911.
[9] David I Farrant, Guillermo H Kaufmann, Jon N Petzing, et al. Measurement of Transient Deformations With Dual-Pulse Addition Electronic Speckle-Pattern Interferometry [J]. Applied Optics(S1559-128X), 1998, 37(31): 7259-7267.
[11] Pablo D Ruiz, Jonathan M Huntley, Ricky D Wildman. Depth-resolved Whole-field Displacement Measurement by Wavelength-scanning Electronic Speckle Pattern Interferometry [J]. Applied Optics(S1559-128X), 2005, 44(19): 3945-3953.
[13] Tajik N, Soltani N, Sedighiani K. Fracture Parameter Analysis on A Double Edge Crack Problem by the Method of Electronic Speckle Pattern Interferometry [C]// 11th International Conference on the Mechanical Behavior of Materials (ICM11), Milano, Italy, June 5-9, 2011, 10: 3267-3272.