Research of Single Event Response Characteristics of Trench Gate SiC MOSFET Devices

CHENG Guodong; LU Jiang; ZHAI Luqing; BAI Yun; TIAN Xiaoli; ZUO Xinxin; YANG Chengyue; TANG Yidan; CHEN Hong; LIU Xinyu

doi:10.13911/j.cnki.1004-3365.210313

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