• Chinese Optics Letters
  • Vol. 20, Issue 10, 101301 (2022)
Xuerui Sun1, Yinan Wu1, Chuanyi Lu1, Yuting Zhang1, Hao Li1, Shijie Liu1, Yuanlin Zheng1、2、*, and Xianfeng Chen1、2、3、**
Author Affiliations
  • 1State Key Laboratory of Advanced Optical Communication Systems and Networks, School of Physics and Astronomy, Shanghai Jiao Tong University, Shanghai 200240, China
  • 2Shanghai Research Center for Quantum Sciences, Shanghai 201315, China
  • 3Collaborative Innovation Center of Light Manipulation and Applications, Shandong Normal University, Jinan 250358, China
  • show less
    DOI: 10.3788/COL202220.101301 Cite this Article Set citation alerts
    Xuerui Sun, Yinan Wu, Chuanyi Lu, Yuting Zhang, Hao Li, Shijie Liu, Yuanlin Zheng, Xianfeng Chen. Experimental investigation on the unbalanced Mach–Zehnder interferometer on lithium niobate thin film[J]. Chinese Optics Letters, 2022, 20(10): 101301 Copy Citation Text show less
    (a) Schematic of the UMZI with a length difference of ΔL. MMI, multimode interference coupler. (b) Schematic of the MMI from different view angles. (c) Calculated effective index neff of optical modes versus the ridge waveguide width with an air upper cladding. (d) Calculated loss of the MMI with respect to its length. The MMI width is 2.80 µm.
    Fig. 1. (a) Schematic of the UMZI with a length difference of ΔL. MMI, multimode interference coupler. (b) Schematic of the MMI from different view angles. (c) Calculated effective index neff of optical modes versus the ridge waveguide width with an air upper cladding. (d) Calculated loss of the MMI with respect to its length. The MMI width is 2.80 µm.
    Experimentally measured EL of the MMI coupler. Inset: optical microscopy image of the MMI coupler.
    Fig. 2. Experimentally measured EL of the MMI coupler. Inset: optical microscopy image of the MMI coupler.
    (a) Optical microscope image of the UMZI. Insets: SEM images of the grating coupler and MMI components, respectively. (b) False-color SEM image of the cross section of the ridge waveguide. (c) The simulation of the fundamental TE mode at 1550 nm.
    Fig. 3. (a) Optical microscope image of the UMZI. Insets: SEM images of the grating coupler and MMI components, respectively. (b) False-color SEM image of the cross section of the ridge waveguide. (c) The simulation of the fundamental TE mode at 1550 nm.
    Normalized transmission spectrum of the fabricated UMZI.
    Fig. 4. Normalized transmission spectrum of the fabricated UMZI.
    (a) Thermo-optic tuning performance of the UMZI. (b) The FSRs of the UMZI at temperatures from 20°C to 70°C. (c) Wavelength shift and FSR as a function of the temperature. (d) The measured output power varying with temperature and its fitting curve at 1534.34 nm.
    Fig. 5. (a) Thermo-optic tuning performance of the UMZI. (b) The FSRs of the UMZI at temperatures from 20°C to 70°C. (c) Wavelength shift and FSR as a function of the temperature. (d) The measured output power varying with temperature and its fitting curve at 1534.34 nm.
    (a) Measured transmitted optical spectrum analyzer (OSA) spectra as a function of input power. (b) Maximum output signal and its wavelength versus input power.
    Fig. 6. (a) Measured transmitted optical spectrum analyzer (OSA) spectra as a function of input power. (b) Maximum output signal and its wavelength versus input power.
    (a) Electro-optical tuning performance of the UMZI. (b) The FSRs of the UMZI at voltages from 20 V to 45 V. (c) Wavelength shift and FSR as a function of the voltage. (d) The measured output power varying with voltage and its fitting curve at 1549.3 nm.
    Fig. 7. (a) Electro-optical tuning performance of the UMZI. (b) The FSRs of the UMZI at voltages from 20 V to 45 V. (c) Wavelength shift and FSR as a function of the voltage. (d) The measured output power varying with voltage and its fitting curve at 1549.3 nm.
    Xuerui Sun, Yinan Wu, Chuanyi Lu, Yuting Zhang, Hao Li, Shijie Liu, Yuanlin Zheng, Xianfeng Chen. Experimental investigation on the unbalanced Mach–Zehnder interferometer on lithium niobate thin film[J]. Chinese Optics Letters, 2022, 20(10): 101301
    Download Citation