• Infrared and Laser Engineering
  • Vol. 47, Issue 2, 225002 (2018)
Ren Jiaojiao1、*, Li Lijuan1, Zhang Dandan1, and Qiao Xiaoli2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: 10.3788/irla201847.0225002 Cite this Article
    Ren Jiaojiao, Li Lijuan, Zhang Dandan, Qiao Xiaoli. Terahertz time domain spectral reflective tomography technology[J]. Infrared and Laser Engineering, 2018, 47(2): 225002 Copy Citation Text show less
    References

    [3] Hartwick T S, Hodges D T, Barker D H, et al. Far infrared imagery[J]. Applied Optics, 1976, 15(8): 1919-22.

    [4] Hu B B, Zhang X C, Auston D H, et al. Free-space radiation from electro-optic crystals[J]. Applied Physics Letters, 1990, 56(6): 506-508.

    [6] Wang S, Zhang X. Pulsed terahertz tomography [J]. Journal of Physics D Applied Physics, 2004, 37(4): R1.

    [7] Takayanagi J, Jinno H, Ichino S, et al. High-resolution time-of-flight terahertz tomography using a femtosecond fiber laser [J]. Optics Express, 2009, 17(9): 7549-55.

    [8] Ren J, Li L, Zhang D, et al. Study on intelligent recognition detection technology of debond defects for ceramic matrix composites based on terahertz time domain spectroscopy[J]. Applied Optics, 2016, 55(26): 7204-7211.

    [9] Zhou Xiaodan, Li Lijuan, Zhao Duo, et al. Application of terahertz technology in nondestruct testing of ceramic matrix composite defects[J]. Infrared and Laser Engineering, 2016, 45(8): 0825001.(in Chinese)

    Ren Jiaojiao, Li Lijuan, Zhang Dandan, Qiao Xiaoli. Terahertz time domain spectral reflective tomography technology[J]. Infrared and Laser Engineering, 2018, 47(2): 225002
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