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Journals >
Laser & Optoelectronics Progress >
Volume 55 >
Issue 12 >
Page 121003 > Article
Laser & Optoelectronics Progress
Vol. 55, Issue 12, 121003 (2018)
Image Salient Object Detection Combined with Deep Learning
Heng Zhao
*
and Weisheng An
**
Author Affiliations
School of Mechanical Engineering, Southwest Jiaotong University, Chengdu, Sichuan 610031, China
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DOI:
10.3788/LOP55.121003
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Heng Zhao, Weisheng An. Image Salient Object Detection Combined with Deep Learning[J]. Laser & Optoelectronics Progress, 2018, 55(12): 121003
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Fig. 1.
Schematic of algorithm
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Fig. 2.
Examples of image processing. (a) Initial image; (b) convolved images; (c) clustered images; (d) CRF optimized images; (e) truth value chart
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Fig. 3.
Loss L versus number of iterations
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Fig. 4.
Comparison among P-R curves by several algorithms. (a) ECSSD; (b) DUT-ORMON
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Fig. 5.
Comparison among image salient detection results by several algorithms. (a) Initial images; (b) GT; (c) proposed algorithm; (d) DCL; (e) DRFI; (f) DS; (g) ELD; (h) FT; (i) MDF; (j) QCUT; (k) RC; (l) RFCN
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Algorithm
ECSSD
DUT-OMRON
F
MAE
F
MAE
Proposed
0.877
0.046
0.689
0.048
DCL
0.863
0.047
0.681
0.053
DRFI
0.732
0.080
0.545
0.083
DS
0.824
0.075
0.598
0.062
ELD
0.814
0.050
0.609
0.059
FT
0.379
0.121
0.311
0.106
MDF
0.795
0.079
0.603
0.064
QCUT
0.743
0.121
0.495
0.072
RC
0.680
0.098
0.678
0.110
RFCN
0.873
0.047
0.681
0.057
Table 1.
Comparison of F and MAE
Algorithm
Proposed
DCL
DS
ELD
MDF
RFCN
Time /s
0.3
1.5
1.1
0.5
8
4.6
Table 2.
Comparison of time consuming
Abstract
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References (24)
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Heng Zhao, Weisheng An. Image Salient Object Detection Combined with Deep Learning[J]. Laser & Optoelectronics Progress, 2018, 55(12): 121003
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Paper Information
Category: Image Processing
Received: May. 14, 2018
Accepted: Jun. 8, 2018
Published Online: Dec. 8, 2018
The Author Email: Zhao Heng (zhlance@foxmail.com), An Weisheng (anweisheng@home.swjtu.edu.cn)
DOI:
10.3788/LOP55.121003
Recommended Topics
laser devices and laser physics
Lasers and Laser Optics
Laser physics
laser manufacturing
Instrumentation, Measurement and Metrology
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