• Opto-Electronic Engineering
  • Vol. 32, Issue 11, 68 (2005)
[in Chinese] and [in Chinese]
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  • [in Chinese]
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    [in Chinese], [in Chinese]. Reliable matching method based on wavelet edge enhancement[J]. Opto-Electronic Engineering, 2005, 32(11): 68 Copy Citation Text show less
    References

    [2] Jane YOU,Prabir BHATTACHARYA . A wavelet-based coarse-to-fine image matching scheme in a parallel virtual machine environment[J]. IEEE Trans. on Image Processing,2000,9(9):1547-1559.

    [3] Chi-Man PUN,Moon-Chuen LEE. Log-polar wavelet energy signatures for rotation and scale invariant texture classification[J]. IEEE Trans. on Pattern Analysis and Machine Intelligence,2003,25(5):590-603.

    [6] Stephane MALLAT,Sifen ZHONG. Characterization of signals from multiscale edges[J]. IEEE Trans. on Pattern Analysis and Machine Intelligence,1992,14(7):710-732.

    [in Chinese], [in Chinese]. Reliable matching method based on wavelet edge enhancement[J]. Opto-Electronic Engineering, 2005, 32(11): 68
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