• Opto-Electronic Engineering
  • Vol. 31, Issue z1, 124 (2004)
[in Chinese]1, [in Chinese]2, [in Chinese]1, [in Chinese]1, and [in Chinese]1
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  • 1[in Chinese]
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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Surface analysis using AFM and XPS for LiBq4/ITO and LiBq4/CuPc/IITO[J]. Opto-Electronic Engineering, 2004, 31(z1): 124 Copy Citation Text show less
    References

    [1] YANG J H, GORDON K C, ZIDON Y, et al. Light-emitting devices based on ruthenium(Ⅱ)(4,7-diphenyl-1, 10-phenanthroline)3:Device response rate and efficiency by use of tris-(8-hydroxyquinoline) aluminum [J]. J. Appl. Phys, 2003, 94(10): 6391-6395.

    [2] TANG C W, VANSLYKE S A, CHEN C H. Electroluminescence of doped organic thin films[J]. J. Appl. Phys, 1989, 65(9):3610-3616.

    [3] PEVMANS P, BVLOVIC V, FORREST S R. Efficient, high-bandwidth organic multilayer photodetectors[J]. Applied Physics Letters, 2000, 76 (26): 3855-3857.

    [4] SCHON J H, KLOC C H, BATLOGG B. Efficient photovoltaic energy conversion in pentacene-based heterojunctions[J].Applied Physics Letters, 2000, 77(16): 2473-2475.

    [5] LI Hai-rong, ZHANG Fu-jia, WANG Yan-yong, et al. Synthesis and Characterization of tris-(8-hydroxyquinoline) aluminum[J].Materials Science and Engineering B, 2003, 100(1): 40-46.

    [6] ZHENG Dai-shun, LI Hai-rong, WANG Yan-yong, et al. Surface and interface analysis of tris-(8-hydroxyquinoline) aluminum and indium-tin-oxide using atomic force microscopy (AFM) and X-ray photoelectron spectroscopy(XPS)[J]. Applied Surface Science, 2001, 183(2): 165-172.

    [7] ZHENG Dai-shun, GAO Zhao-yang, HE Xi-yuan, et al. Surface and interface analysis for copper phthalocyanine(CuPc) and indium-tin-oxide(ITO) using X-ray photoelectron pectroscopy(XPS) [J]. Applied Surface Science, 2003, 211(1): 24-30.

    [8] PENG Y Q, ZHANG F J, ZHANG X, et al. Numerical study of the current conduction in single-layer organic light-emiiting devices[J]. Appl. phys. A, 2004, 78(12): 369-373.

    [10] PEISERT H, SCHWIEGER T, AUERHAMMER J M, et al. Order on disorder: Copper phthalocyanine thin films on technical substrates [J]. J. Appl. Phys, 2001, 90(1): 466-469.

    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Surface analysis using AFM and XPS for LiBq4/ITO and LiBq4/CuPc/IITO[J]. Opto-Electronic Engineering, 2004, 31(z1): 124
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