Sample selection based on direct estimation of cell under test clutter characteristics

Qin QIN; Zi-Mei TU; Ming LI

doi:10.11972/j.issn.1001-9014.2021.02.010

Journals >Journal of Infrared and Millimeter Waves >Volume 40 >Issue 2 >Page 198 > Article

Journal of Infrared and Millimeter Waves
Vol. 40, Issue 2, 198 (2021)

Sample selection based on direct estimation of cell under test clutter characteristics

Qin QIN¹, Zi-Mei TU^1、*, and Ming LI²

Author Affiliations

¹College of Engineering，Shanghai Polytechnic University，Shanghai 201209，China

²School of Information and Communication Engineering，University of Electronic Science and Technology of China，Chengdu 611731，China

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DOI: 10.11972/j.issn.1001-9014.2021.02.010 Cite this Article

Qin QIN, Zi-Mei TU, Ming LI. Sample selection based on direct estimation of cell under test clutter characteristics[J]. Journal of Infrared and Millimeter Waves, 2021, 40(2): 198 Copy Citation Text

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Fig. 1. Example distribution of the target and outliers in the spatial-temporal domain

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Test statistics against range bin for different algorithm (a) GIP algorithm, (b) Recon-GIP algorithm, (c) Direct estimation algorithm based on CUT clutter characteristics

Fig. 2. Test statistics against range bin for different algorithm (a) GIP algorithm, (b) Recon-GIP algorithm, (c) Direct estimation algorithm based on CUT clutter characteristics

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Fig. 3. STAP output power against range bin for different algorithms

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Fig. 4. Comparison graph of SCNR loss for different algorithms

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Qin QIN, Zi-Mei TU, Ming LI. Sample selection based on direct estimation of cell under test clutter characteristics[J]. Journal of Infrared and Millimeter Waves, 2021, 40(2): 198

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