• Chinese Journal of Quantum Electronics
  • Vol. 17, Issue 1, 81 (2000)
[in Chinese]1 and [in Chinese]2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • show less
    DOI: Cite this Article
    [in Chinese], [in Chinese]. The Influence of Ablation of Film Materials by Laser onZ-scan Measurement[J]. Chinese Journal of Quantum Electronics, 2000, 17(1): 81 Copy Citation Text show less

    Abstract

    During the measurement of optical nonlinearities of sample in the thin film by Z-scan technique, ablating makes a hole in the thin film if the incidental laser power is too high, that will produce the error to measurement results. We analyze the positive and negative lens effect caused by the hole theoretically and give the expression of normalized transmittance in this condition.
    [in Chinese], [in Chinese]. The Influence of Ablation of Film Materials by Laser onZ-scan Measurement[J]. Chinese Journal of Quantum Electronics, 2000, 17(1): 81
    Download Citation