• Acta Optica Sinica
  • Vol. 35, Issue 2, 223002 (2015)
Xiao Qing1、2、*, Wang Xinglong2, Fu Qian2, Zhang Dalong2, Liu Xia1, Deng Jianqin1, and Cao Dingxiang1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: 10.3788/aos201535.0223002 Cite this Article Set citation alerts
    Xiao Qing, Wang Xinglong, Fu Qian, Zhang Dalong, Liu Xia, Deng Jianqin, Cao Dingxiang. An Optical Device for On-Line Measurement of Thickness[J]. Acta Optica Sinica, 2015, 35(2): 223002 Copy Citation Text show less
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    [10] Xue Hui, Shen Weidong, Gu Peifu, et al.. Thickness measurement of thin film based on white-light spectral interferometry [J]. Acta Optical Sinica, 2009, 29(7): 1877-1880.

    [11] Yan Chengzhi, Li Shangyuan, Zheng Xiaoping, et al.. Time delay error in optical low coherence interferometry [J]. Chinese J Lasers, 2011, 38(1): 0108003.

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    Xiao Qing, Wang Xinglong, Fu Qian, Zhang Dalong, Liu Xia, Deng Jianqin, Cao Dingxiang. An Optical Device for On-Line Measurement of Thickness[J]. Acta Optica Sinica, 2015, 35(2): 223002
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