[1] Sun Changku, Ye Shenghua. Laser Measurement Technology[M]. Tianjin: Tianjin University Press, 2001,129～131

[2] Jiang Xiangqian, L. Blunt. Advance in the three-dimensional surface metrology[J]. J. Engineering Design, 2000, (4): 98～100

[3] Ph. Contet, J. F. Ville. Surfascan 3D- An industrial 3D surface texture characterization instrument[J]. International Journal of Machine Tools and Manufacture, 1995, 35(2):151～156

[4] Bennett J M. Recent development in surface roughness characterization[J]. Meas. Sci. Technol., 1992, 3(8): 1119～1127

[5] Zhang Dongxian, Zhang Haijun. A new type of atomic force microscope and its applications[J]. Acta Photonica Sinica, 2002, 31(1): 51～54

[6] Shi Yang, Zhang Haijun. Study on a novel atomic force microscope with large scanning range[J]. Opto-Electronic Engineering, 2004, 31(6): 30～33

[7] Feng Junyan, Feng Qibo, Kuang Cuifang. Present status of high precision laser displacement sensor based on triangulation[J]. J. Appl. Opt., 2004, 25(3): 33～36

[8] Zhang Yiyi, He Jie, Shang Guangyi et al.. An atomic force microscope[J]. Acta Optica Sinica, 1995, 15(1): 112～116

[9] Idesawa M. A system to generate a solid figure from three views[J]. Bulletin of the JSME, 1973, 16(92): 216～225

[10] Qing Xujia, Ji Fengxin, Gao Zhaofa. Realistic representation of B-Rep Model-Based 3D solid[J]. Mechanical Science and Technology, 2001, 20(2): 283～285