• Chinese Optics Letters
  • Vol. 8, Issue 3, 296 (2010)
Bin Ma1、2、3, Zhengxiang Shen1、3, Pengfei He2, Yiqin Ji3, Tian Sang1、4, Huasong Liu1、3, Dandan Liu3, and Zhanshan Wang1、3
Author Affiliations
  • 1Institute of Precision Optical Engineering, Tongji University, Shanghai 200092, China
  • 2School of Aerospace Engineering and Applied Mechanics, Tongji University, Shanghai 200092, China
  • 3Tianjin Key Laboratory of Optical Thin Films, Tianjin Jinhang Institute of Technical Physics, Tianjin 300192, China
  • 4Department of Physics, Qiannan Normal College for Nationalities, Duyun 558000, China
  • show less
    DOI: 10.3788/COL20100803.0296 Cite this Article Set citation alerts
    Bin Ma, Zhengxiang Shen, Pengfei He, Yiqin Ji, Tian Sang, Huasong Liu, Dandan Liu, Zhanshan Wang. Detection of subsurface defects of fused silica optics by confocal scattering microscopy[J]. Chinese Optics Letters, 2010, 8(3): 296 Copy Citation Text show less
    References

    [1] P. E. Miller, T. I. Suratwala, L. L. Wong, M. D. Feit, J. A. Menapace, P. J. Davis, and R. A. Steele, Proc. SPIE 5991, 599101 (2005).

    [2] T. Suratwala, L. Wong, P. Miller, M. D. Feit, J. Menapace, R. Steele, P. Davis, and D. Walmer, J. Non-Cryst. Solids 352, 5601 (2006).

    [3] D. Golini and S. D. Jacobs, Proc. SPIE 1333, 80 (1990).

    [4] C. L. Battersby, L. M. Sheehan, and M. R. Kozlwski, Proc. SPIE 3578, 446 (1998).

    [5] Z. M. Liao, S. J. Cohen, and J. R. Taylor, Proc. SPIE 2428, 43 (1995).

    [6] D. Black, R. Polvani, L. Braun, B Hockey, and G. White, Proc. SPIE 3060, 102 (1997).

    [7] J. Wang, R. L. Maier, and J. H. Burning, Proc. SPIE 5188, 106 (2003).

    [8] G. Dussler, B. Brocher, and T. Pfeifer, Proc. SPIE 3825, 144 (1999).

    [9] T. Zamofing and H. Hugli, Proc. SPIE 5265, 134 (2004).

    [10] M. I. Mishchenko, L. D. Travis, and A. A. Lacis, Scattering, Absorption, and Emission of Light by Small Particles (Cambridge University Press, Cambridge, 2004).

    [11] K.-N. Liou, Appl. Math. Comput. 3, 331 (1977).

    [12] K. R. Fine, R. Garbe, T. Gip, and Q. Nguyen, Proc. SPIE 5799, 105 (2005).

    [13] J. Neauport, P. Cormont, P. Legros, C. Ambard, and J. Destribats, Opt. Express 17, 3543 (2009).

    [14] K. R. Spring, T. J. Fellers, and M. W. Davidson, "Resolution and contrast in confocal microscopy" http://www.olympusconfocal.com/throry/resolutionintro.html (Jan. 8, 2009).

    [15] P. Torok and T. Wilson, Opt. Commun. 137, 127 (1997).

    CLP Journals

    [1] Shizhen Xu, Xiaotao Zu, Xiaodong Yuan. Localized CO2 laser treatment and post-heating process to reduce the growth coef f icient of fused silica surface damage[J]. Chinese Optics Letters, 2011, 9(6): 061405

    Data from CrossRef

    [1] Chang-Soo Kim, Hongki Yoo. Three-dimensional confocal reflectance microscopy for surface metrology. Measurement Science and Technology, 32, 102002(2021).

    [2] I Abdul Rasheed, Swati Paul, Inder Mohan Chhabra, Mahender Kumar Gupta, P Manimaran, Karthikeyan Balasubramanian. Alumina abrasive grains mediated grinding induced glass surface and fractal analysis of SiO2 glass. Engineering Research Express, 3, 025042(2021).

    [3] Jing-fei Yin, Qian Bai, Bi Zhang. Methods for Detection of Subsurface Damage: A Review. Chinese Journal of Mechanical Engineering, 31, 41(2018).

    Bin Ma, Zhengxiang Shen, Pengfei He, Yiqin Ji, Tian Sang, Huasong Liu, Dandan Liu, Zhanshan Wang. Detection of subsurface defects of fused silica optics by confocal scattering microscopy[J]. Chinese Optics Letters, 2010, 8(3): 296
    Download Citation