Detection of subsurface defects of fused silica optics by confocal scattering microscopy

Bin Ma; Zhengxiang Shen; Pengfei He; Yiqin Ji; Tian Sang; Huasong Liu; Dandan Liu; Zhanshan Wang

doi:10.3788/COL20100803.0296

Journals >Chinese Optics Letters >Volume 8 >Issue 3 >Page 296 > Article

Chinese Optics Letters
Vol. 8, Issue 3, 296 (2010)

Detection of subsurface defects of fused silica optics by confocal scattering microscopy

Bin Ma^1、2、3, Zhengxiang Shen^1、3, Pengfei He², Yiqin Ji³, Tian Sang^1、4, Huasong Liu^1、3, Dandan Liu³, and Zhanshan Wang^1、3

Author Affiliations

¹Institute of Precision Optical Engineering, Tongji University, Shanghai 200092, China

²School of Aerospace Engineering and Applied Mechanics, Tongji University, Shanghai 200092, China

³Tianjin Key Laboratory of Optical Thin Films, Tianjin Jinhang Institute of Technical Physics, Tianjin 300192, China

⁴Department of Physics, Qiannan Normal College for Nationalities, Duyun 558000, China

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DOI: 10.3788/COL20100803.0296 Cite this Article Set citation alerts

Bin Ma, Zhengxiang Shen, Pengfei He, Yiqin Ji, Tian Sang, Huasong Liu, Dandan Liu, Zhanshan Wang. Detection of subsurface defects of fused silica optics by confocal scattering microscopy[J]. Chinese Optics Letters, 2010, 8(3): 296 Copy Citation Text

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