• Acta Photonica Sinica
  • Vol. 53, Issue 1, 0112003 (2024)
Tao LIU1, Zhibin WANG1, Jiaqi HU1, Yaonan HE1, Weichang JING1, Enjing CHEN2, Wenlong ZHOU3, Guoming YU1, Ning YANG4, Di ZHAO4, Guofeng ZHANG1, and Shuming YANG1、*
Author Affiliations
  • 1School of Mechanical Engineering,Xi'an Jiaotong University,Xi'an 710049,China
  • 2Ostar-optical Micro-nano Optoelectronics Co.,Ltd.,Xi'an 710077,China
  • 3Motic China Group Co.,Ltd.,Xiamen 361006,China
  • 4National Market Supervision Key Laboratory of Measurement Optics and Applications,Shaanxi Institute of Metrology Science,Xi'an 710100,China
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    DOI: 10.3788/gzxb20245301.0112003 Cite this Article
    Tao LIU, Zhibin WANG, Jiaqi HU, Yaonan HE, Weichang JING, Enjing CHEN, Wenlong ZHOU, Guoming YU, Ning YANG, Di ZHAO, Guofeng ZHANG, Shuming YANG. Research on Large Field-of-view White Light Interferometry Measurement System and Performance[J]. Acta Photonica Sinica, 2024, 53(1): 0112003 Copy Citation Text show less
    Schematic of the optical path of large field-of-view WLI system
    Fig. 1. Schematic of the optical path of large field-of-view WLI system
    Measured spectral curve for the white LED source
    Fig. 2. Measured spectral curve for the white LED source
    Simulated distribution curve of white light interference signal before and after filtering
    Fig. 3. Simulated distribution curve of white light interference signal before and after filtering
    Actual raw interference signal for the white LED source at a certain position
    Fig. 4. Actual raw interference signal for the white LED source at a certain position
    Actual white light interference signal with different spectral filters
    Fig. 5. Actual white light interference signal with different spectral filters
    Apparatus of large field-of-view white light interferometer
    Fig. 6. Apparatus of large field-of-view white light interferometer
    Field-of-view at the object side
    Fig. 7. Field-of-view at the object side
    Test of the lateral resolution
    Fig. 8. Test of the lateral resolution
    Photo of the standard step sample
    Fig. 9. Photo of the standard step sample
    Measurement result of the standard step 1
    Fig. 10. Measurement result of the standard step 1
    Measurement result of the standard step 2
    Fig. 11. Measurement result of the standard step 2
    Test of the reticle
    Fig. 12. Test of the reticle
    Test of the MEMS structure
    Fig. 13. Test of the MEMS structure
    Test of the SiO2 film on a Si wafer
    Fig. 14. Test of the SiO2 film on a Si wafer
    ParametersGroup 1Group 2Group 3Group 4
    Center wavelength/nm540550585600
    Bandwidth/nm80100170240
    Table 1. Basic parameters of the customized bandpass filters
    PointsDirection 1Direction 2Direction 3Direction 4
    10.950.940.940.94
    20.940.940.940.94
    30.940.940.940.94
    40.940.940.940.94
    50.940.940.940.94
    60.940.940.940.94
    70.940.940.940.94
    80.940.940.950.94
    90.940.940.950.95
    100.950.950.950.95
    Table 2. Test of the effective lateral magnification
    Number12345678910AverageStandard deviation
    Step 12.0522.0442.0332.0322.0482.0342.0622.0392.0562.0632.0460.012
    Step 220.45420.44920.47420.45520.50220.48320.46120.46620.45920.47220.4680.016
    Table 3. Ten repeated measurement results of the standard step sample
    X direction
    Y direction1.040.970.970.970.971.05
    1.041.050.970.960.971.05
    1.041.051.040.961.051.13
    1.041.041.050.960.961.04
    1.041.041.041.051.051.05
    1.041.041.041.041.041.04
    1.041.041.041.041.041.04
    1.041.041.041.041.041.04
    1.041.031.031.031.041.05
    1.041.041.041.031.041.04
    Table 4. Film thickness measurement results of the central fraction
    Tao LIU, Zhibin WANG, Jiaqi HU, Yaonan HE, Weichang JING, Enjing CHEN, Wenlong ZHOU, Guoming YU, Ning YANG, Di ZHAO, Guofeng ZHANG, Shuming YANG. Research on Large Field-of-view White Light Interferometry Measurement System and Performance[J]. Acta Photonica Sinica, 2024, 53(1): 0112003
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