• Opto-Electronic Engineering
  • Vol. 31, Issue 12, 61 (2004)
[in Chinese], [in Chinese], and [in Chinese]
Author Affiliations
  • [in Chinese]
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    DOI: Cite this Article
    [in Chinese], [in Chinese], [in Chinese]. Millimeter-wave image edge detection based on adaptive binarization[J]. Opto-Electronic Engineering, 2004, 31(12): 61 Copy Citation Text show less
    References

    [1] WILLIAM L,STEWART II. Passive millimeter wave imaging considerations for tactical aircraft[J]. Aerospace and Electronic Systems Magazine,IEEE,2002,17(12):11-15.

    [2] ZHANG Guang-feng,ZHANG Zu-yin,GUO Wei. Research on optimal millimeter-wave image[A]. 2003 national conference on Millimeter-wave[C]. Shanghai:The Chinese Institute of Electronics,2003. 992-996. (in Chinese).

    [3] RAFAEL Gonzalez,RICHAR Woods. Digital Image Processing Second Edition [M] . Beijing:Publishing House of Electronics Industry,2003. 463-482.

    [4] ZHOU Xinming,LAN Sai,XU Yan. Comparison of the Edge Detection Algorithms in Image Processing [J]. Modern Electric Power,2002,17(3):65-69.(in Chinese).

    [5] LIU Xun,YOU Zhiming. An image edge detection method based on multi-scale morphology [J]. Opto-Electronic Engineering,2003,30(3):56-58. (in Chinese).

    [6] WU Bing,QIN Zhi-yuan. New Approaches for the Automatic Selection of the Optimal Threshold in Image Binarization[J]. Journal of Institute of Surveying and Mapping,2002,18(4):283-286.(in Chinese).

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    [2] Yang Xiaoming, Zheng Sanchao, Huang Gaokun, Zhou Sumei. Fourier Transform of 2D Moiré Fringe[J]. Laser & Optoelectronics Progress, 2017, 54(9): 92302

    [in Chinese], [in Chinese], [in Chinese]. Millimeter-wave image edge detection based on adaptive binarization[J]. Opto-Electronic Engineering, 2004, 31(12): 61
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