• Infrared and Laser Engineering
  • Vol. 35, Issue 1, 82 (2006)
[in Chinese]1、2
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  • 1[in Chinese]
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    [in Chinese]. Measurement and analysis of surface profiles by optical scattering method[J]. Infrared and Laser Engineering, 2006, 35(1): 82 Copy Citation Text show less
    References

    [4] HARVEY J E,THOMPSON P L,VERNOLD C L.Understanding surface scatter effects in grazing incidence X-Ray telescopes[C]//Proceedings of SPIE,X-Ray Optics,Instruments and Missions,1998,3444:518-525.

    [5] HARVEY J E,LEWOTSKY K L,KOTHA A.Effects of surface scatter on the optical performance of X-ray synchrotron beamline mirrors [J].Applied Optics,1995,34 (16):3024-3032.

    [6] HARVEY J E,MORAN E C,ZMEK W P.Transfer function characterization of grazing incidence optical systems [J].Appl Opt,1998,27:1527-1533.

    [7] HARVEY J E.Transfer function characterization of scattering surfaces[J].J Opt Soc Am,1976,66:1136.

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    [in Chinese]. Measurement and analysis of surface profiles by optical scattering method[J]. Infrared and Laser Engineering, 2006, 35(1): 82
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