[1] Shi Zhonghua, Yang Baoxi, Wei Zhangfan, et al. Research progress in optical mirror spacing measurement technology[J]. Laser & Optoelectronics Progress, 2015, 52(4): 1-6. (in Chinese)
[2] Lu Yi, Xu Xiping, Shi Nuo, et al. Research on measurement method and device of lens center thickness[J]. Journal of Changchun University of Science and Technology, 2013, 36(3): 28-31. (in Chinese)
[3] Song Qiang, Yang Baoxi, Yuan Qiao. Research on detection method of large diameter convex aspherical surface shape[J]. Chinese Journal of Lasers, 2014, 41(4): 0408003. (in Chinese)
[4] Li Yanfeng, Li Xiuyu, Yang Liu. A fast glass refractive index measurement method based on machine vision[J]. Acta Photonica Sinica, 2017, 46(11): 138-144. (in Chinese)
[5] Xiong Fen, Hu Zhong, Jiang Mingda. High-precision non-contact measurement of refractive index based on parallel plates[J]. Journal of Applied Optics, 2012, 33(1): 148-152.(in Chinese)
[6] Qiao Yang, Zhang Ning, Xu Xiping, et al. Design of lens thickness measurement system based on confocal method[J]. Journal of Instrument and Instrument Technology, 2011, 32(7): 1635-1641. (in Chinese)
[7] Shi Libo, Qiu Lirong, Wang Yun, et al. Development of laser thickness confocal lens center thickness measurement system[J]. Journal of Scientific Instrument, 2012, 33(3): 683-688. (in Chinese)
[8] Xue Hui. Measurement method of physical thickness of optical film based on white light interference[J]. Acta Optica Sinica, 2009, 29(7): 1877-1880. (in Chinese)
[9] Wang Zhibin, Shi Guohua, He Yi, et al. Application of optical coherence tomography in optical surface spacing measurement[J]. Optics and Precision Engineering, 2012, 20(7): 1469-1474. (in Chinese)
[10] Galli M, Marabelli F, Guizzetti G. Direct measurement of refractive-index dispersion of transparent media by white-light interferometry[J]. Applied Optics, 2003, 42(10): 3910-3914.
[11] Hee Joo Choi, Hwan Hong Lim, Han Seb Moon, et al. Measurement of refractive index and thickness of transparent plate by dual-wavelength interference[J]. Optics Express, 2010, 18(8): 9429-9434.
[12] Jin Chaoqun, Yang Baoxi, Hu Xiaobang, et al. Measurement method of low-coherence light interference high-precision lens center thickness[J]. Chinese Journal of Lasers, 2017, 44(6): 0604002. (in Chinese)
[13] Liu Fuguo, Zha Xuejun, Yang Bo, et al. Research on lens center thickness measurement method based on fiber low coherence interference technique[J]. Applied Laser, 2016, 36(5): 605-610. (in Chinese)
[15] Bae J, Park J, Ahn H, et al. Total physical thickness measurement of a multi-layered wafer using a spectral-domain interferometer with an optical comb[J]. Opt Express, 2017, 25(6): 12689-12697.
[16] Arosa Y, Lago E L, Fuente R de la. Refractive index measurements in absorbing media with white light spectral interferometry[J]. Optics Express, 2018, 26(11): 7578-7586.
[17] Maeng S, Park J, Jin J. Uncertainty improvement of geometrical thickness and refractive index measurement of a silicon wafer using a femtosecond pulse laser[J]. Opt Express, 2012, 20(13): 12184-12190.