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    Journals >Acta Optica Sinica >Volume 33 >Issue 10 >Page 1009001 > Article
    • Acta Optica Sinica
    • Vol. 33, Issue 10, 1009001 (2013)
    Surface Profile Measurement of Microstructures Based on Dual-Wavelength Digital Microscopic Image-Plane Holography
    Zeng Yanan*, Wang Fei, Lei Hai, Hu Xiaodong, and Hu Xiaotang
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    DOI: 10.3788/aos201333.1009001 Cite this Article Set citation alerts
    Zeng Yanan, Wang Fei, Lei Hai, Hu Xiaodong, Hu Xiaotang. Surface Profile Measurement of Microstructures Based on Dual-Wavelength Digital Microscopic Image-Plane Holography[J]. Acta Optica Sinica, 2013, 33(10): 1009001 Copy Citation Text show less
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    Zeng Yanan, Wang Fei, Lei Hai, Hu Xiaodong, Hu Xiaotang. Surface Profile Measurement of Microstructures Based on Dual-Wavelength Digital Microscopic Image-Plane Holography[J]. Acta Optica Sinica, 2013, 33(10): 1009001
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