Thermal damage of infrared focal plane detector Dewar and its environmental test

Jianlin Li; Zhuolin Liu; Xiaoyan Chen; Yongchang Lei; Wei Dong; Kunlun Qian

doi:10.3788/IRLA20210337

Journals >Infrared and Laser Engineering >Volume 51 >Issue 4 >Page 20210337 > Article

Infrared and Laser Engineering
Vol. 51, Issue 4, 20210337 (2022)

Thermal damage of infrared focal plane detector Dewar and its environmental test

Jianlin Li¹, Zhuolin Liu², Xiaoyan Chen¹, Yongchang Lei¹..., Wei Dong¹ and Kunlun Qian¹|Show fewer author(s)

Author Affiliations

¹Kunming Institute of Physics, Kunming 650223, China

²Mililary Representation Office of Equipment Department of China PLA Air Force in Kunming Area, Kunming 650223, China

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DOI: 10.3788/IRLA20210337 Cite this Article

Jianlin Li, Zhuolin Liu, Xiaoyan Chen, Yongchang Lei, Wei Dong, Kunlun Qian. Thermal damage of infrared focal plane detector Dewar and its environmental test[J]. Infrared and Laser Engineering, 2022, 51(4): 20210337 Copy Citation Text

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Fig. 1. Infrared detector

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Fig. 2. Structure and technology of infrared focal plane detector Dewar assembly

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Fig. 3. Time constant and temperature response curve

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Fig. 4. Mini Dewar temperature response curve

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Fig. 5. Screening strength curve

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Part			Phase	Failure mode	Acceleration factor
IDDCA	Cooler		Storage	Leakage	Hot temperature
				Leakage	Temperature cycles
				Qutgassing	Hot temperature
			Operational	Bearings and moving parts wear or break	FPA temperature
					High ambient temperature
					Dewar heat load
	DDA	Vacuum	Storage	Leakage	Temperature cycles
			Storage	Leakage	Hot temperature
			Operational	Qutgassing	Temperature cycles
			Operational	Qutgassing	Hot temperature
		Connections	Storage	Bondings aging	Hot temperature
		Connections	Operational	Bondings break	Temperature cycles
		FPA	Storage	Diodes degradations (increase of defective pixels)	Hot temperature
		FPA	Operational	Loss of connections (increase of defective pixels)	Number of cooldown cycles

Table 1. Main failure modes of thermorunaway of infrared detectors^[8]

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Category	Test procedure		Standard	Temperature extremes	Test duration	Transfer time
Storage test	High temperatures or low temperatures	Constant temperature storage	GJB 1788—1993	+40-+70 ℃ 0-−62 ℃	24-168 h 24-120 h	—
			GJB 2345—1995	+70 ℃ −60 ℃	72 h 72 h	—
			MIL−D−49172A	+71 ℃，−54 ℃	—	—
			SOFRADIR	+71 ℃ −54 ℃	1500 h 6 months	—
			GJB 5244—2004 GJB 7247—2011 GJB 5029A—2015 GJB 6791—2009 GJB 150.3—1986	+70 ℃ −55 ℃	48 h 24 h	—
			GJB 150.3A—2009	+71 ℃，−54 ℃	—	≤3 ℃/min
Temperature shock test	High temperatures or low temperatures.	Constant temperature shock	GJB 1788—1993	+40-+85 ℃ −10-−62 ℃	0.5 h 1.2 h	<5 min，3 or 5 cycles
			GJB 2345—1995	+70 ℃，−55 ℃	12 h	<5 min，3 cycles
			MIL-D-49172A SOFRADIR	+71 ℃，−54 ℃	—	—
			GJB 5244—2004 GJB 7247—2011	+70 ℃，−55 ℃	—	<5 min，5 cycles
			GJB 150.5—1986 MIL-STD-810C	+70 ℃，−55 ℃	1 h	5 min，3 cycles
			GJB 150.5A—2009 MIL-STD-810F	+71 ℃，−54 ℃	—	1 min，≥3 cycles

Table 2. Procedure of infrared detector temperature environment test

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		Temperature extremes/℃	Test duration	Transfer time
Environmental tests	Temperature storage	+71	72 h	−
	Temperature storage	−54	72 h	−
	Temperature shock	+71	1 h	1 min, ≥5 cycles
	Temperature shock	−54	1 h	1 min, ≥5 cycles
Reliability tests	Temperature cycles	+71	1 h	≥10 ℃/min, 12 cycles
		−54	1 h	≥10 ℃/min, 12 cycles
		+71	30 min	≥30 ℃/min, 50 or 100 cycles
		−193	30 min	≥30 ℃/min, 50 or 100 cycles
	Temperature storage	+71	1500 h	−
	Temperature storage	−54	6 months	−
	Accelerated degradation test^[13]	+90	2160 h	−

Table 3. Test magnitude and duration of the trouble-free temperature environmental test

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