• High Power Laser and Particle Beams
  • Vol. 34, Issue 2, 023002 (2022)
Zhitong Cui, Wei Chen, Yayun Dong, Xin Nie, Wei Wu, and Feng Qin
Author Affiliations
  • State Key Laboratory of Intense Pulsed Radiation Simulation and Effect, Northwest Institute of Nuclear Technology, Xi’an 710024, China
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    DOI: 10.11884/HPLPB202234.210406 Cite this Article
    Zhitong Cui, Wei Chen, Yayun Dong, Xin Nie, Wei Wu, Feng Qin. Circuit Simulation of GJB151B CS115 Part І: The analysis of calibration equipment indicators[J]. High Power Laser and Particle Beams, 2022, 34(2): 023002 Copy Citation Text show less
    References

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    [7] Xu Liang, Xu Ming. Analysis of conducted susceptibility requirement f GJB151B[J]. Journal of Microwaves, 2016 (S2): 3: 441443

    [9] Cui Z T, Grassi F, Pignari A S. Circuit modeling of the test setup f pulsed current injection[C]Proceedings of 2016 IEEE 2012 AsiaPacific Symposium on Electromagic Compatibility. 2016.

    [11] Cui Z T, Wei B, Grassi F, Pignari A S. A pulsed current injection setup and procedure to reproduce intense transient electromagnetic disturbance[J]. IEEE Transactions on Electromagnetic Compatibility, 60, 2065-2068(2018).

    [12] Cui Z T, Wei B, Grassi F, Pignari A S. Experimental analysis circuit modeling of pulsed current injection in wire pairs[C]Proceedings of IEEE Symposium on Electromagic Compatibility. 2018.

    [14] Lofon F, Belakhouy Y, Daran F. Injection probe modeling f bulk current injection test on multiconduct transmission lines[C]Proceedings of IEEE Symposium on Embedded Electromagic Compatibility. 2007.

    [15] Cui Zhitong. Simulation experimental research on HEMP pulsed current injection[D]. Xi’An: Xidian University, 2020

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    Zhitong Cui, Wei Chen, Yayun Dong, Xin Nie, Wei Wu, Feng Qin. Circuit Simulation of GJB151B CS115 Part І: The analysis of calibration equipment indicators[J]. High Power Laser and Particle Beams, 2022, 34(2): 023002
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