Strip Defect Classification Based on Improved Generative Adversarial Networks and MobileNetV3

Jiang Chang; Shengqi Guan; Hongyu Shi; Luping Hu; Yiqi Ni

doi:10.3788/LOP202158.0410016

Journals >Laser & Optoelectronics Progress >Volume 58 >Issue 4 >Page 0410016 > Article

Laser & Optoelectronics Progress
Vol. 58, Issue 4, 0410016 (2021)

Strip Defect Classification Based on Improved Generative Adversarial Networks and MobileNetV3

Jiang Chang¹, Shengqi Guan^1、2、*, Hongyu Shi³, Luping Hu¹, and Yiqi Ni¹

Author Affiliations

¹School of Mechanical and Electronic Engineering, Xi'an Polytechnic University, Xi'an, Shaanxi 710048, China

²Shaoxing Keqiao West-Tex Textile Industry Innovative Institute, Shaoxing, Zhejiang 312030, China

³School of Computer Science, Xi'an Polytechnic University, Xi'an, Shaanxi 710048, China

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DOI: 10.3788/LOP202158.0410016 Cite this Article Set citation alerts

Jiang Chang, Shengqi Guan, Hongyu Shi, Luping Hu, Yiqi Ni. Strip Defect Classification Based on Improved Generative Adversarial Networks and MobileNetV3[J]. Laser & Optoelectronics Progress, 2021, 58(4): 0410016 Copy Citation Text

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