• Opto-Electronic Engineering
  • Vol. 34, Issue 2, 45 (2007)
[in Chinese]1、2、3, [in Chinese]1, [in Chinese]1、2, [in Chinese]1、2, and [in Chinese]3
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
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    DOI: Cite this Article
    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Calibration of thermopile detectors based upon the information quantification of infrared remote sensing[J]. Opto-Electronic Engineering, 2007, 34(2): 45 Copy Citation Text show less
    References

    [1] Alan L.MIGDALL,GEORGE P.EPPELDAUER.NIST MEASUREMENT SERVISES:Spectroradiometric Detector Measurements:Part Ⅲ-Infrared Detectors[M].Washington.DC:US Government Printing Office,1998.

    [5] J.E.M(U)LLER,E.KESSLER,U.DILLNER,et al.Large Sized High Sensitive Thin-Film Thermopiles as Radiometric Detector Standard[J].Microtechnology in Metrology and Metrology in Microsystems,2000,31(8):147-148.

    [6] J.E.M(U)LLER,E.KESSLER,U.DILLNER,et al.Large-Size High-Sensitive Thermo-pile as a Radiometric Standard[J].UVNEWS (HUT Helsinki),1999,2 (4):32-35.

    [7] Barry N.TAYLOR,Chris E.KUYATT.Guidelines for evaluating and expressing the uncertainty of NIST measurement results[A].NIST Technical Note 1297[M].Washington.DC:US Government Printing Office,1994.

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Calibration of thermopile detectors based upon the information quantification of infrared remote sensing[J]. Opto-Electronic Engineering, 2007, 34(2): 45
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