[1] Su X Y, Zhang Q C, Chen W J. Three-dimensional imaging based on structured illumination[J]. Chinese Journal of Lasers, 41, 0209001(2014).
[2] Chen S L, Xia R B, Zhao J et al. Analysis and reduction of phase errors caused by nonuniform surface reflectivity in a phase-shifting measurement system[J]. Optical Engineering, 56, 033102(2017). http://spie.org/Publications/Journal/10.1117/1.OE.56.3.033102
[3] Liu G H, Liu X Y, Feng Q Y. 3D shape measurement of objects with high dynamic range of surface reflectivity[J]. Applied Optics, 50, 4557-4565(2011). http://www.opticsinfobase.org/abstract.cfm?uri=ao-50-23-4557
[4] Jiang H Z, Zhao H J, Li X D. High dynamic range fringe acquisition: a novel 3-D scanning technique for high-reflective surfaces[J]. Optics and Lasers in Engineering, 50, 1484-1493(2012). http://www.sciencedirect.com/science/article/pii/S0143816612000978
[5] Kowarschik R, Kühmstedt P, Geber J et al. Adaptive optical three-dimensional measurement with structured light[J]. Optical Engineering, 39, 150-158(2000). http://www.mendeley.com/catalog/adaptive-optical-threedimensional-measurement-structured-light/
[6] Lin H, Song Z. 3D reconstruction of specular surface via a novel structured light approach[C]. IEEE International Conference on Information and Automation, 530-534(2015).
[7] Song Z, Jiang H L, Lin H B et al. A high dynamic range structured light means for the 3D measurement of specular surface[J]. Optics and Lasers in Engineering, 95, 8-16(2017). http://www.sciencedirect.com/science/article/pii/S0143816617303287
[8] Xing W, Zhang F M, Feng W et al. Three-dimensional measurement method of objects with specular surface besed on digital micromirror device[J]. Acta Optica Sinica, 37, 1212002(2017).
[9] Waddington C, Kofman J[C]. Saturation avoidance by adaptive fringe projection in phase-shifting 3D surface-shape measurement IEEE International Symposium on Optomechatronic Technologies, 2010, 1-4.
[10] Waddington C, Kofman J. Camera-independent saturation avoidance in measuring high-reflectivity-variation surfaces using pixel-wise composed images from projected patterns of different maximum gray level[J]. Optics Communications, 333, 32-37(2014). http://www.sciencedirect.com/science/article/pii/S0030401814006579
[11] Feng S J, Zhang Y Z, Chen Q et al. General solution for high dynamic range three-dimensional shape measurement using the fringe projection technique[J]. Optics and Lasers in Engineering, 59, 56-71(2014). http://www.sciencedirect.com/science/article/pii/S0143816614000633
[12] Waddington C, Kofman J. Modified sinusoidal fringe-pattern projection for variable illuminance in phase-shifting three-dimensional surface-shape metrology[J]. Optical Engineering, 53, 084109(2014). http://spie.org/Publications/Journal/10.1117/1.OE.53.8.084109
[13] Li D, Kofman J. Adaptive fringe-pattern projection for image saturation avoidance in 3D surface-shape measurement[J]. Optics Express, 22, 9887-9901(2014).
[14] Zuo C, Huang L, Zhang M et al. Temporal phase unwrapping algorithms for fringe projection profilometry: a comparative review[J]. Optics and Lasers in Engineering, 85, 84-103(2016). http://www.sciencedirect.com/science/article/pii/S0143816616300653
[15] Chen S L, Zhao J B, Xia R B. Improvement of the phase unwrapping method based on multi-frequency heterodyne principle[J]. Acta Optica Sinica, 36, 0412004(2016).
[16] Liu K, Wang Y, Lau D L et al. Gamma model and its analysis for phase measuring profilometry[J]. Journal of the Optical Society of America A, 27, 553-562(2010). http://www.opticsinfobase.org/abstract.cfm?URI=josaa-27-3-553
[17] Zheng D L, Da F P. Gamma correction method for accuracy enhancement in grating projection profilometry[J]. Acta Optica Sinica, 31, 0512003(2011).
[18] Zhang X, Zhu L M. Phase error model from Gamma distortion and Gamma calibration[J]. Acta Optica Sinica, 32, 0412006(2012).
[19] Cui Y J, Zhang W F, Li J X et al. A method of Gamma correction in fringe projection measurement[J]. Acta Optica Sinica, 35, 0112002(2015).
[20] Waddington C, Kofman J. Analysis of measurement sensitivity to illuminance and fringe-pattern gray levels for fringe-pattern projection adaptive to ambient lighting[J]. Optics and Lasers in Engineering, 48, 251-256(2010). http://www.sciencedirect.com/science/article/pii/S0143816609001626
[21] Li Z W, Shi Y S, Zhong K et al. Projector calibration algorithm for the structured light measurement technique[J]. Acta Optica Sinica, 29, 3061-3065(2009).
[22] Xie Z X, Chi S K, Wang X M et al. Calibration method for structure-light auto-scanning measurement system based on coplanarity[J]. Chinese Journal of Lasers, 43, 0308003(2016).