Key Contour Feature Extraction of Printed Circuit Board Point Cloud

Wenbin Zhong; Xurui Li; Si Sun; Guangshuai Liu

doi:10.3788/LOP57.141001

Journals >Laser & Optoelectronics Progress >Volume 57 >Issue 14 >Page 141001 > Article

Laser & Optoelectronics Progress
Vol. 57, Issue 14, 141001 (2020)

Key Contour Feature Extraction of Printed Circuit Board Point Cloud

Wenbin Zhong¹, Xurui Li^2、*, Si Sun², and Guangshuai Liu²

Author Affiliations

¹The 10th Research Institute of China Electronics Technology Group Corporation, Chengdu, Sichuan 610036, China

²School of Mechanical Engineering, Southwest Jiaotong University, Chengdu, Sichuan 610031, China

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DOI: 10.3788/LOP57.141001 Cite this Article Set citation alerts

Wenbin Zhong, Xurui Li, Si Sun, Guangshuai Liu. Key Contour Feature Extraction of Printed Circuit Board Point Cloud[J]. Laser & Optoelectronics Progress, 2020, 57(14): 141001 Copy Citation Text

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Wenbin Zhong, Xurui Li, Si Sun, Guangshuai Liu. Key Contour Feature Extraction of Printed Circuit Board Point Cloud[J]. Laser & Optoelectronics Progress, 2020, 57(14): 141001

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