• Laser & Optoelectronics Progress
  • Vol. 55, Issue 12, 122901 (2018)
Lin Sun and Qingfeng Cui*
Author Affiliations
  • College of Opto-Electronic Engineering, Changchun University of Science and Technology, Changchun, Jilin 130022, China
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    DOI: 10.3788/LOP55.122901 Cite this Article Set citation alerts
    Lin Sun, Qingfeng Cui. Analysis and Calculation of Veiling Glare Index of Optical Imaging Systems[J]. Laser & Optoelectronics Progress, 2018, 55(12): 122901 Copy Citation Text show less
    Schematic of TracePro software
    Fig. 1. Schematic of TracePro software
    Structure diagram of R-C optical system
    Fig. 2. Structure diagram of R-C optical system
    PST simulation results
    Fig. 3. PST simulation results
    PST simulation results when 0.5°≤θ≤3°
    Fig. 4. PST simulation results when 0.5°≤θ≤3°
    PST simulation results when 3°<θ≤90°
    Fig. 5. PST simulation results when 3°<θ≤90°
    DeviceABgReflectivityTransmissivityAbsorptivity
    Reflector0.0030450.00110.98
    Lens0.00063720.000110.995
    Black paint0.0004650.0013.50.95
    Table 1. ABg parameters for the surface of each material
    Lin Sun, Qingfeng Cui. Analysis and Calculation of Veiling Glare Index of Optical Imaging Systems[J]. Laser & Optoelectronics Progress, 2018, 55(12): 122901
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