[1] D. S. Anderson and J. H. Burge, Proc. SPIE 2536, 169 (1995).

[2] Q. Wang, Proc. SPIE 4231, 39 (2000).

[3] D. Malacara, Optical Shop Testing (Wiley, 1992).

[4] R. R. Cordero and I. Lira, Opt. Commun. 237, 25 (2004).

[5] S. O’Donohue, G. Devries, P. Murphy, G. Forbes, and P. Dumas, Proc. SPIE 5869, 58690T (2005).

[6] S. Han and E. Novak, Proc. SPIE 4399, 131 (2001).

[7] K. L. Shu, Appl. Opt. 22, 1879 (1983).

[8] J. E. Negro, Appl. Opt. 23, 1921 (1984).

[9] S. Aric, K. William, and T. Marc, Proc. SPIE 5494, 81 (2004).

[10] F. Jon, D. Paul, E. M. Paul, and W. F. Greg, Proc. SPIE 5188, 296 (2003).

[11] C. J. Kim, Appl. Opt. 21, 4521(1984).

[12] T. W. Stuhlinger, Proc. SPIE 656, 118 (1986).

[13] M. Otsubo, K. Okada, and J. Tsujiuchi, Opt. Eng. 33, 608 (1994).

[14] M. Otsubo and J. Tsujiuchi, Proc. SPIE 1720, 444 (1992).

[15] M. Tricard, A. Shorey, B. Hallock, and P. Murphy, Proc. SPIE 6273, 62730L (2006).

[16] P. Murphy, J. Fleig, and G. Forbes, Proc. SPIE 6293, 62930J (2006).

[17] T. Marc, D. Paul, and F. Greg, Proc. SPIE 5638, 284 (2005).

[18] A. Kulawiec, P. Murphy, and M. D. Marco, Proc. SPIE 7655, 765512 (2010).

[19] C. Zhao and J. H. Burge, Proc. SPIE 7063, 7063 (2008).

[20] P. Su, "Absolute measurements of large mirrors," PhD. Thesis (University of Arizona, 2008).

[21] X. Wang, "Research on the technique for testing of aspheric surfaces by sub-aperture stitching interferometry," PhD. Thesis (Changchun Institute of Optics, Fine Mechanics and Physics, 2008).

[22] X. K. Wang, L. G. Zheng, and B. Z. Zhang, Proc. SPIE 7283, 72832J (2009).

[23] X. K. Wang and L. H. Wang, Chin. Opt. Lett. 11, 645 (2007).

[24] L. Yan, X. Wang, and L. Zheng, Opt. Express 21, 22628 (2013).

[25] P. F. Zhang, H. Zhao, and X. Zhou, Opt. Express 18, 15216 (2010).