• Chinese Optics Letters
  • Vol. 21, Issue 3, 032502 (2023)
Xingye Zhou, Yuanjie Lü*, Hongyu Guo, Xubo Song, Yuangang Wang, Shixiong Liang, Aimin Bu, and Zhihong Feng**
Author Affiliations
  • National Key Laboratory of ASIC, Hebei Semiconductor Research Institute, Shijiazhuang 050051, China
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    DOI: 10.3788/COL202321.032502 Cite this Article Set citation alerts
    Xingye Zhou, Yuanjie Lü, Hongyu Guo, Xubo Song, Yuangang Wang, Shixiong Liang, Aimin Bu, Zhihong Feng. High-stability 4H-SiC avalanche photodiodes for UV detection at high temperatures[J]. Chinese Optics Letters, 2023, 21(3): 032502 Copy Citation Text show less
    Device structure of 4H-SiC APDs. (a) Schematic cross-sectional structure; (b) doping concentration profile of epilayers obtained by SIMS.
    Fig. 1. Device structure of 4H-SiC APDs. (a) Schematic cross-sectional structure; (b) doping concentration profile of epilayers obtained by SIMS.
    Characteristics of 4H-SiC APDs at room temperature. (a) I-V and I-M curves; (b) spectral responsivity. Here, the photo image of the fabricated 4H-SiC APD is shown in the inset of Fig. 2(a).
    Fig. 2. Characteristics of 4H-SiC APDs at room temperature. (a) I-V and I-M curves; (b) spectral responsivity. Here, the photo image of the fabricated 4H-SiC APD is shown in the inset of Fig. 2(a).
    Performance of 4H-SiC APDs at different temperatures. (a) Dark currents near the breakdown voltage; (b) breakdown voltage shift as a function of temperature.
    Fig. 3. Performance of 4H-SiC APDs at different temperatures. (a) Dark currents near the breakdown voltage; (b) breakdown voltage shift as a function of temperature.
    Two-dimensional mapping of the junction temperature for 4H-SiC APDs with different maximum junction temperatures. (a) 145°C; (b) 270°C.
    Fig. 4. Two-dimensional mapping of the junction temperature for 4H-SiC APDs with different maximum junction temperatures. (a) 145°C; (b) 270°C.
    Dark current of 4H-SiC APD as a function of aging time with different stress conditions. (a) 175°C/100 µA; (b) 200°C/100 µA; (c) 200°C/500 µA.
    Fig. 5. Dark current of 4H-SiC APD as a function of aging time with different stress conditions. (a) 175°C/100 µA; (b) 200°C/100 µA; (c) 200°C/500 µA.
    ParametersRef. [19]Ref. [20]This Work
    Vb (V)634186163
    Idark@95%Vb (A/μm2)5×10141.7×10171.1×1015
    Gain2500>106>106
    Maximum QE (%)45%@290 nm53%@290 nm54%@285 nm
    CT of Vb (mV/°C)110147.4
    Table 1. Comparison of Different 4H-SiC APDs
    Xingye Zhou, Yuanjie Lü, Hongyu Guo, Xubo Song, Yuangang Wang, Shixiong Liang, Aimin Bu, Zhihong Feng. High-stability 4H-SiC avalanche photodiodes for UV detection at high temperatures[J]. Chinese Optics Letters, 2023, 21(3): 032502
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