• Acta Photonica Sinica
  • Vol. 52, Issue 6, 0631001 (2023)
Xiuhua FU1,2, Junqi LIU1,*, Zhuolin LI3, Haicheng LIU1..., Haifeng REN4, Yibo WANG1 and Kexu HAN1|Show fewer author(s)
Author Affiliations
  • 1College of Optoelectronic Engineering, Changchun University of Science and Technology, Changchun 130022, China
  • 2Zhongshan Research Institute, Changchun University of Science and Technology, Zhongshan 528436, China
  • 3Moral Education and Comprehensive Teaching and Research Training Department, Jilin Provincial Institute of Education, Changchun 130022, China
  • 4Guang Chi Technology (Shanghai) Co., Ltd., Shanghai 200444, China
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    DOI: 10.3788/gzxb20235206.0631001 Cite this Article
    Xiuhua FU, Junqi LIU, Zhuolin LI, Haicheng LIU, Haifeng REN, Yibo WANG, Kexu HAN. Study on Thickness Uniformity of Double-sided Sputtering Film on Large-diameter Ultra-thin Substrates[J]. Acta Photonica Sinica, 2023, 52(6): 0631001 Copy Citation Text show less
    References

    [1] Guo ZHU. Multiscale simulation and experimental study of physical processes involved in magnetron sputtering deposition(2019).

    [2] Jinfa TANG, Peifu GU, Xu LIU et al. Modern optical thin film technology(2006).

    [3] He YU. Mathematical modeling and experimental study of various sputter deposition and corresponding film properties(2013).

    [4] Jianquan SONG, Zhengtang LIU, Zhongqi YU et al. Simulation of thickness distribution of planar magnetron sputtering film. Mechanical Science and Technology, 884-885,794(2001).

    [5] Xiangxiu ZHANG, Pengfei ZHANG, Jinzhu ZHAO et al. Effect of substrate motion mode on uniformity of magnetron sputtering rectangular target coating. Vacuum, 53, 1-5(2016).

    [6] Chunxue GAO, Zhiwei ZHAO, Xuehua LI. Modeling of thermal stresses in elastic multilayer coating systems. Journal of Applied Physics, 117, 055305(2015).

    [7] M SHISHKOV, D POPOV. Thickness uniformity of thin films deposited on a flat substrate by sputtering of a target with rotational symmetry. Vacuum, 42, 1005-1008(1991).

    [8] S MAHIEU, G BUYLE, D DEPLA et al. Monte Carlo simulation of the transport of atoms in DC magnetron sputtering. Nuclear Instruments and Methods in Physics Research Section B:Beam Interactions with Materials and Atoms, 243, 313-319(2006).

    [9] Xudong TAN, Zi MA, Bangwei CAI. Simulating uniformity of film thickness with finite-elements method. Laser Technology, 27, 480-483(2003).

    [10] Jinfa TANG, Quan DENG. Applied thin film optics(1984).

    [11] C FU, C YANG, L HAN et al. The thickness uniformity of films deposited by magnetron sputtering with rotation and revolution. Surface and Coatings Technology, 200, 3687-3689(2006).

    [12] Lei PAN, Xiaoqiang WANG, Zhong ZHANG et al. Preparation of Mo/Si multilayer film with high uniformity diameter of 120mm by magnetron sputtering. High Power Laser and Particle Beam, 22, 1535-1538(2010).

    [13] Z ZHANG, R QI, Y YAO et al. Improving thickness uniformity of Mo/Si multilayers on curved spherical substrates by a masking technique. Coatings, 9, 851(2019).

    [14] Boyang WEI, Dongmei LIU, Xiuhua FU et al. Study on film thickness uniformity of magnetron sputtering system based on twin target. Acta Optica Sinica, 41, 0731001(2021).

    [15] He YU, Tao WANG, Zhiming WU et al. Study on film deposition uniformity of male-rotation magnetron sputtering coating system. Journal of Vacuum Science and Technology, 30, 149-153(2010).

    Xiuhua FU, Junqi LIU, Zhuolin LI, Haicheng LIU, Haifeng REN, Yibo WANG, Kexu HAN. Study on Thickness Uniformity of Double-sided Sputtering Film on Large-diameter Ultra-thin Substrates[J]. Acta Photonica Sinica, 2023, 52(6): 0631001
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