• Laser & Optoelectronics Progress
  • Vol. 54, Issue 11, 111001 (2017)
Huang Yilong1, Zhao Jufeng1、*, Zhang Keqi2, Hua Weiping1, and Cui Guangmang1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: 10.3788/lop54.111001 Cite this Article Set citation alerts
    Huang Yilong, Zhao Jufeng, Zhang Keqi, Hua Weiping, Cui Guangmang. Gradient Constrained Microscopic Imaging Quality Improvement Method with Objective Lens Measurement[J]. Laser & Optoelectronics Progress, 2017, 54(11): 111001 Copy Citation Text show less
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    Huang Yilong, Zhao Jufeng, Zhang Keqi, Hua Weiping, Cui Guangmang. Gradient Constrained Microscopic Imaging Quality Improvement Method with Objective Lens Measurement[J]. Laser & Optoelectronics Progress, 2017, 54(11): 111001
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