• Chinese Journal of Quantum Electronics
  • Vol. 17, Issue 1, 90 (2000)
[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], and [in Chinese]
Author Affiliations
  • [in Chinese]
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    DOI: Cite this Article
    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Measurement System of Angle-resolved Scattering under Multiwavelength Illumination[J]. Chinese Journal of Quantum Electronics, 2000, 17(1): 90 Copy Citation Text show less

    Abstract

    In this paper, the principle and automatic measurement system of angle-resolved scattering are described. The dynamic range, sensitivity and reproductively are discussed. The angle-resolved scattering distribution and polarization properties of polytetrafluoroethylene diffuse reflectance plate are measured under multiwavelength laser illumination in order to test the system function and properties.
    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Measurement System of Angle-resolved Scattering under Multiwavelength Illumination[J]. Chinese Journal of Quantum Electronics, 2000, 17(1): 90
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