Quantitative Determination of Parameters of Substrate Using Near-Infrared Spectroscopy Technique

YU Yong-hua

doi:10.3964/j.issn.1000-0593(2011)11-2928-04

Journals >Spectroscopy and Spectral Analysis >Volume 31 >Issue 11 >Page 2928 > Article

Spectroscopy and Spectral Analysis
Vol. 31, Issue 11, 2928 (2011)

Quantitative Determination of Parameters of Substrate Using Near-Infrared Spectroscopy Technique

YU Yong-hua^*

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[in Chinese]

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DOI: 10.3964/j.issn.1000-0593(2011)11-2928-04 Cite this Article

YU Yong-hua. Quantitative Determination of Parameters of Substrate Using Near-Infrared Spectroscopy Technique[J]. Spectroscopy and Spectral Analysis, 2011, 31(11): 2928 Copy Citation Text

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References

[5] Sheng Q Y, Li P P, Zhang X L. Applied Mechanics and Materials, 2011, 43： 361.

[6] Verma A N, Tandon P. Proceedings of the Indian National Science Academy, 1984, 3(B50)： 326.

[9] Malley D F, Mcclure C, Martin P D. Communications in Soil Science and Plant Analysis, 2005, 36(4)： 455.

YU Yong-hua. Quantitative Determination of Parameters of Substrate Using Near-Infrared Spectroscopy Technique[J]. Spectroscopy and Spectral Analysis, 2011, 31(11): 2928

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