• Chinese Journal of Quantum Electronics
  • Vol. 25, Issue 4, 471 (2008)
Yan-ling XUE*
Author Affiliations
  • [in Chinese]
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    DOI: Cite this Article
    XUE Yan-ling. Influence of electronic correlation on FWM and XPM in Si-EDFAs and Te-EDFAs[J]. Chinese Journal of Quantum Electronics, 2008, 25(4): 471 Copy Citation Text show less

    Abstract

    Analyses show that the linewidth of emission spectra of EDFA determines the 4f shell electronic correlation. It influences the electronic dipole-dipole interaction and the resonantly enhanced nonlinearity of erbium ions. Si-EDFAs and Te-EDFAs,with different emission linewidths,correspond to different level of resonantly enhanced nonlinearities. Comparison of crosstalk induced by four-wave mixing and cross-phase modulation in Si-EDFAs and Te-EDFAs is carried out using semiclassical theory. The results show that Te-EDFA corresponds to much smaller crosstalk than Si-EDFA,and therefore is more appropriate for DWDM communications.
    XUE Yan-ling. Influence of electronic correlation on FWM and XPM in Si-EDFAs and Te-EDFAs[J]. Chinese Journal of Quantum Electronics, 2008, 25(4): 471
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