[1] Yan Ming, Gao Zhishan． Phase shifting method for measuring the phase retardation of wave plates[J]． J Optoelectronics Laser, 2005, 16(2): 183-187. (in Chinese)

[2] Wang Zhengping, Li Qingbo, Tan Qiao, et al. Method of measuring the practical retardance value and judging the fast or slow axis of a quarter-wave plate[J]. Chinese J Lasers, 2005, 32(4): 523-528. (in Chinese)

[3] Zhao Pei, Wu Fuquan, Hao Dianzhong, et al. Measurement of the delay of the quarter-wave plate by phase-modulated ellipsometry[J]. Acta Optic Sinica, 2006, 26(3): 379-382. (in Chinese)

[4] Zhao Tingsheng, Li Guohua, Peng Handong, et al. Phase shift measurement of a retarder based on Fourier analysis[J]. Acta Optic Sinica, 2008, 28(1): 105-109. (in Chinese)

[5] Wang Jun, Chen Lei, Liu Zhaodong, et al. Method of measuring retardation of zero-order wave plate based on hue value of white-light interference color[J]. Infrared and Laser Engineering, 2011, 40(9): 1784-1788. (in Chinese)

[6] Liao Yanbiao. Polarization Optics[M]. Beijing: Science Press, 2003: 48-49. (in Chinese)

[7] Jones R C. A new calculation for the treatment of optical systems: I;II;III[J]. JOSA, 1941, 31(7): 488-503

[8] Theocaris P S, Gdoutos E E. Matrix Theory of Photoelasticity[M]. Yang Jihui Transl. Beijing: Science Press, 1987: 49-85. (in Chinese)

[9] Bo Feng, Zhu Jianqiang, Kang Jun. Precise measurement and factors analysis for phase retardation of wave plate[J]. Chinese J Lasers, 2007, 34(6): 851-856. (in Chinese)