Author Affiliations
1Anhui Institute of Optics and Fine Mechanics, Hefei Institute of Physical Science, Chinese Academy of Sciences, Hefei, Anhui 230031, China2University of Science and Technology of China, Hefei, Anhui 230026, China3Key Laboratory of Optical Calibration and Characterization of Chinese Academy of Sciences, Hefei, Anhui 230031, Chinashow less
Fig. 1. Spatial heterodyne spectrometer. (a) Schematic of optical path; (b) monolithic SHS interferometer
Fig. 2. Variation of interference intensity in the direction of dispersion at different wavelengths
Fig. 3. Relationship between wavenumber and modulation
Fig. 4. Simulation results
Fig. 5. Transmittance curve of the flat-field correction filter
Fig. 6. Layout of experimental breadboard
Fig. 7. Relative illumination curve of the system(selected characteristic wavelengths of the interference working filter and flat-field filter are 1575 nm and 1500 nm, respectively)
Fig. 8. Experimental results. (a) Interferogram of flat-field filter; (b) interferogram of working filter
Fig. 9. Comparison between single-row flat-field data and interference data
Fig. 10. Comparison of flat-field correction effect. (a) Interferogram before flat-field correction; (b) interferogram after flat-field correction
Fig. 11. Comparison of single-row interference data before and after flat-field correction
Fig. 12. Effect of flat-field correction on recovery spectrum
Parameter | Value |
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Littrow wavelength /μm (Wave number /cm-1) | 1.567(6381.6) | Spectral range /nm(Wave number /cm-1) | 1568--1583(6317--6377) | Grating density /(line·mm-1) | 250 | Spectral resolution /nm | 0.1 | Magnification of imaging system | -0.317∶1 | Grating size /cm | 3.134 | Pixel size-20 μm | 640×512 |
|
Table 1. Main parameters of CO2 spatial heterodyne spectrometer
Parameter | Before flat-field correction | After flat-field correction |
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| 35.1 | 75.7 | Relative intensity of high-frequency /% | 10.0 | 1.6 | Fixed frequency noise | Non-corrected | Corrected |
|
Table 2. Effects of flat-field correction