Author Affiliations
1National Laboratory on High Power Laser and Physics, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China2National Laboratory on High Power Laser and Physics, China Academy of Engineering Physics, Chinese Academy of Sciences, Shanghai 201800, China3University of Chinese Academy of Science, Beijing 100049, Chinashow less
Fig. 1. Schematic diagram of PIE with highly tilted illumination. (a) Optical path schematic; (b) flowchart of the algorithm
Fig. 2. Diffraction patterns with different incident angles. (a) Diffraction pattern calculated by spherical wave integration based on Huygens-Fresnel principle with large incident angle; (b) diffraction pattern calculated by the revised angular spectrum with the same incident angle; (c) diffraction pattern when the incident angle is 3°; (d) diffraction pattern when the incident angle is 0°
Fig. 3. Simulated initial value. (a) Amplitude of specimen; (b) phase of specimen; (c) amplitude of probe light; (d)phase of probe light
Fig. 4. Representative 9 diffraction patterns of dataset
Fig. 5. Reconstructed results based on general ePIE algorithm with highly tilted illumination after 500 iterations. (a) Amplitude of specimen; (b) phase of specimen; (c) amplitude of probe light; (d) phase of probe light
Fig. 6. Reconstructed results based on revised angular spectrum and ePIE after 500 iterations. (a) Amplitude of specimen; (b) phase of specimen; (c) amplitude of probe light; (d) phase of probe light
Fig. 7. Error curves corresponding to the two calculation methods
Fig. 8. Reconstructed results at the angle errors from -1.5° to 1.5°. (a) Reconstructed amplitude of probe light; (b) spectrum intensity of probe light; (c) amplitude of specimen; (d)error curve with the change of different angle errors
Fig. 9. Part of diffraction patterns recorded by CCD, in which the coordinates represent the position information among the grid of 10×10
Fig. 10. Experimental results based on revised angular spectrum and ePIE with highly tilted illumination. (a) Amplitude of specimen; (b) phase of specimen; (c) amplitude of probe light; (d) phase of probe light
Fig. 11. Experimental results based on general ePIE algorithm with highly tilted illumination. (a) Amplitude of specimen; (b) phase of specimen; (c) amplitude of probe light; (d) phase of probe light
Fig. 12. Experimental error curves corresponding to the two calculation methods
Fig. 13. Experimental results of USAF 1951 test target. (a) Reconstructed results with the proposed algorithm; (b) locally enlarged view of Fig. 13 (a); (c) reconstructed results with the traditional ePIE algorithm; (d) locally enlarged view of Fig. 13 (c)