[1] Amico P, Bohm T. ESO′s new CCD testbench [J]. Exp Astronomym, 1998, (8): 1-8.

[2] Lesser M P, McCarthy B L. Quantum efficiency characterization of scientific CCDs[C]//SPIE, 1996, 2654: 278-286.

[3] Groom D E, Bebek C J, Fabricius M, et al. Quantum efficiency characterization of LBNL CCD′s [C]//SPIE, 2006, 6068: 101-111.

[4] Steckert J. Design, implementation and setup of an automated quantum efficiency measurement system for charge-coupled devices [D]. Berkeley: Diplom Thesis, 2005.

[5] Shao Xiaopeng, Wang Yang, Gao Peng, et al. Measurement method and setup of the quantum efficiency for charge coupled devices[J]. Infrared and Laser Engineering, 2013, 42(S1): 103-106. (in Chinese)

[6] Emva Standard 1288: Standard for characterization of image sensors and cameras[S]. European Machine Vision Association, 2010.

[7] Zhou Lei, Zhang Junping, Zheng Xiaobing. Radiation flux calibration performed by a single chip detector[J]. Opto-Electronic Engineering, 2005, 32(6): 59-62. (in Chinese)

[8] Ya Feng, Zhou Yue, Zhang Mingchao, et al. Test equipment for relative spectral response of CCD [J]. Spectroscopy and Spectral Analys, 2005, 32(6): 59-62. (in Chinese)

[9] Xu Qiuyun, Zheng Xiaobing, Li Jianjun, et al. Development of laser illuminated integrating sphere source [J]. Optics and Precision Engineering, 2009, 17(4): 738-744. (in Chinese)

[10] Wang Yong, Lv Suhong, Ma Fei, et al. Non synchronous sampling error correction system analysis [J]. Henan Electric Power, 2005, 3: 23-25. (in Chinese)

[11] Holst G C. CCD Arrays, Cameras, and Displays [M]. USA: SPIE Optical Engineering Press, 1998.

[12] Li Yunfei, Li Minjie, Si Guoliang, et al. Noise analyzing and processing of TDI-CCD image sensor[J]. Optics and Precision Engineering, 2007, 15(8): 1196-1202. (in Chinese)